Inventor · disambiguated record
Jang-Man Ko
Also filed as: KO JANG-MAN
4 granted patents·91 citations·filing 1991–2014
77Inventor score
Top patents by PatentIndex Score
4 records- 0189US8711348B2Method of inspecting waferJANG HWAN-SEOK·Filed 2011·Granted Apr 29, 2014·57 cites·11 claims
- 0267US6372556B1Semiconductor device having a fuse and fabricating method thereforSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Apr 16, 2002·19 cites·10 claims
- 0349US8976348B2Wafer inspection systemSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Mar 10, 2015·0 cites·11 claims
- 0439US5147809AMethod of producing a bipolar transistor with a laterally graded emitter (LGE) employing a refill method of polycrystalline siliconSAMSUNG ELECTRONICS CO LTD·Filed 1991·Granted Sep 15, 1992·15 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →