Inventor · disambiguated record
Jae Ha Lee
Also filed as: LEE JAE HA
9 granted patents·4 pending applications·177 citations·filing 2000–2024
85Inventor score
Files withSAMSUNG ELECTRONICS CO LTD3LEE JAE HA2THE INDUSTRY & ACADEMIC COOPERATION IN CHUNGNAM NATIONAL UNIV2HYUNDAI MOTOR CO LTD1KIM HA-YOUNG1
Top patents by PatentIndex Score
13 records- 0191US6750410B2Electric outlet with rotatable receptaclesFiled 2002·Granted Jun 15, 2004·95 cites·17 claims
- 0290US6329616B1Power control apparatusFiled 2000·Granted Dec 11, 2001·74 cites·10 claims
- 0387US9753086B2Scan flip-flop and scan test circuit including the sameKIM HA-YOUNG·Filed 2015·Granted Sep 5, 2017·4 cites·20 claims
- 0484US10429443B2Scan flip-flop and scan test circuit including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Oct 1, 2019·2 cites·19 claims
- 0566US2022228332A1Safety barrierTHE INDUSTRY & ACADEMIC COOPERATION IN CHUNGNAM NATIONAL UNIV·Filed 2022·Application pending·0 cites
- 0659US11287474B2Scan flip-flop and scan test circuit including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Mar 29, 2022·0 cites·18 claims
- 0759US9571076B2Bidirectional delay circuit and integrated circuit including the sameSEO JAE-WOO·Filed 2015·Granted Feb 14, 2017·1 cites·20 claims
- 0858US2025095346A1Method and Apparatus For Generating 3D Ground TruthHYUNDAI MOTOR CO LTD·Filed 2024·Application pending·0 cites
- 0952US12322693B2Integrated circuitSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jun 3, 2025·0 cites·20 claims
- 1052US2019368143A1Safety barrierTHE INDUSTRY & ACADEMIC COOPERATION IN CHUNGNAM NATIONAL UNIV·Filed 2018·Application pending·0 cites
- 1141US8330481B2Probe assembly and manufacturing method thereofLEE JAE HA·Filed 2008·Granted Dec 11, 2012·1 cites·8 claims
- 1240US2011221465A1Probe card and manufacturing method thereofLEE JAE HA·Filed 2009·Application pending·0 cites
- 1339US12239806B2Peritoneal cavity-bladder connecting catheter for ascites drainageUNIV INJE IND ACAD COOP FOUND·Filed 2019·Granted Mar 4, 2025·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →