Inventor · disambiguated record
Jang Jung Lee
Also filed as: LEE JANG JUNG
12 granted patents·4 pending applications·16 citations·filing 2011–2025
86Inventor score
Top patents by PatentIndex Score
16 records- 0191US10746542B2Line edge roughness analysis using atomic force microscopyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Aug 18, 2020·6 cites·20 claims
- 0290US11088036B2Atom probe tomography specimen preparationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Aug 10, 2021·5 cites·17 claims
- 0388US11236996B2Line edge roughness analysis using atomic force microscopyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Feb 1, 2022·2 cites·20 claims
- 0487US11079405B1Method and apparatus for detecting ferroelectric signalTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Aug 3, 2021·2 cites·20 claims
- 0587US2025364207A1Atom probe tomography specimen preparationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0683US2025323014A1Detection systems in semiconductor metrology toolsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0781US12412729B2Atom probe tomography specimen preparationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Sep 9, 2025·0 cites·15 claims
- 0878US2024395636A1Atom probe tomography specimen preparationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0971US12374522B2Detection systems in semiconductor metrology toolsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jul 29, 2025·0 cites·20 claims
- 1070US11774241B2Line edge roughness analysis using atomic force microscopyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Oct 3, 2023·0 cites·20 claims
- 1169US11837435B2Atom probe tomography specimen preparationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Dec 5, 2023·0 cites·18 claims
- 1268US11703523B2Method and apparatus for detecting ferroelectric signalTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jul 18, 2023·0 cites·20 claims
- 1365US2021343603A1Atom probe tomography specimen preparationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Application pending·0 cites
- 1462US11087956B2Detection systems in semiconductor metrology toolsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Aug 10, 2021·0 cites·20 claims
- 1556US8633109B2Soft error rate (SER) reduction in advanced silicon processesLEE YUNG-HUEI·Filed 2011·Granted Jan 21, 2014·1 cites·20 claims
- 1652US11211271B2Systems and methods for semiconductor structure sample preparation and analysisTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Dec 28, 2021·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →