Inventor · disambiguated record
Jackson Leung
Also filed as: LEUNG JACKSON
3 granted patents·17 citations·filing 1999–2002
67Inventor score
Files withTEXAS INSTRUMENTS INC3
Top patents by PatentIndex Score
3 records- 0165US6615391B2Current controlled multi-state parallel test for semiconductor deviceTEXAS INSTRUMENTS INC·Filed 2002·Granted Sep 2, 2003·9 cites·7 claims
- 0232US6408411B1Two pass multi-state parallel test for semiconductor deviceTEXAS INSTRUMENTS INC·Filed 1999·Granted Jun 18, 2002·4 cites·6 claims
- 0332US6381718B1Current controlled multi-state parallel test for semiconductor deviceTEXAS INSTRUMENTS INC·Filed 1999·Granted Apr 30, 2002·4 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →