Inventor · disambiguated record
James Massie
Also filed as: MASSIE JAMES · MASSIE JAMES R · MASSIE JAMES ROBERT
14 granted patents·4 pending applications·412 citations·filing 1993–2020
94Inventor score
Files withVEECO INSTR INC7DIGITAL INSTR INC4Continental automotive systems inc3AGILENT TECHNOLOGIES INC1JAMES MASSIE DESIGN INC1
Top patents by PatentIndex Score
18 records- 0194US5463897AScanning stylus atomic force microscope with cantilever tracking and optical accessDIGITAL INSTR INC·Filed 1993·Granted Nov 7, 1995·115 cites·41 claims
- 0291US9372203B1Actuators for securing probes in a scanning probe microscopeJAMES MASSIE DESIGN INC·Filed 2015·Granted Jun 21, 2016·10 cites·19 claims
- 0387US6612160B2Apparatus and method for isolating and measuring movement in metrology apparatusVEECO INSTR INC·Filed 2001·Granted Sep 2, 2003·29 cites·63 claims
- 0485US5560244AScanning stylus atomic force microscope with cantilever tracking and optical accessDIGITAL INSTR INC·Filed 1995·Granted Oct 1, 1996·70 cites·7 claims
- 0584US6530268B2Apparatus and method for isolating and measuring movement in a metrology apparatusVEECO INSTR INC·Filed 2001·Granted Mar 11, 2003·22 cites·36 claims
- 0683US6590208B2Balanced momentum probe holderVEECO INSTR INC·Filed 2001·Granted Jul 8, 2003·27 cites·18 claims
- 0782US6861649B2Balanced momentum probe holderVEECO INSTR INC·Filed 2003·Granted Mar 1, 2005·25 cites·33 claims
- 0877US5714682AScanning stylus atomic force microscope with cantilever tracking and optical accessDIGITAL INSTR INC·Filed 1996·Granted Feb 3, 1998·42 cites·15 claims
- 0976US6032518AScanning stylus atomic force microscope with cantilever tracking and optical accessDIGITAL INSTR INC·Filed 1998·Granted Mar 7, 2000·59 cites·20 claims
- 1062US7219538B2Balanced momentum probe holderVEECO INSTR INC·Filed 2005·Granted May 22, 2007·2 cites·18 claims
- 1154US12019184B2Hermetically-sealed vehicle lidar assemblyContinental automotive systems inc·Filed 2020·Granted Jun 25, 2024·0 cites·9 claims
- 1253US6928863B2Apparatus and method for isolating and measuring movement in a metrology apparatusVEECO INSTR INC·Filed 2003·Granted Aug 16, 2005·8 cites·47 claims
- 1352US7962966B2Scanning probe microscope having improved optical accessAGILENT TECHNOLOGIES INC·Filed 2009·Granted Jun 14, 2011·1 cites·17 claims
- 1448US2005121615A1Cantilever array sensor systemFiled 2004·Application pending·0 cites
- 1545US2020182124A1Automotive electronic sensor assembly temperature regulation systemContinental automotive systems inc·Filed 2019·Application pending·0 cites
- 1643US2002092340A1Cantilever array sensor systemVEECO INSTR INC·Filed 2001·Application pending·0 cites
- 1742US2020341119A1Actively aligned solid-state lidar systemContinental automotive systems inc·Filed 2019·Application pending·0 cites
- 1826US8087288B1Scanning stylus atomic force microscope with cantilever tracking and optical accessPRATER CRAIG B·Filed 1997·Granted Jan 3, 2012·2 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →