Inventor · disambiguated record
James Mears
Also filed as: MEARS JAMES · MEARS JAMES A
2 granted patents·57 citations·filing 1995–2001
65Inventor score
Files withNAT SEMICONDUCTOR CORP2
Top patents by PatentIndex Score
2 records- 0173US7062696B2Algorithmic test pattern generator, with built-in-self-test (BIST) capabilities, for functional testing of a circuitNAT SEMICONDUCTOR CORP·Filed 2001·Granted Jun 13, 2006·27 cites·16 claims
- 0260US5539400AUltra-low power, scan on demand keypad encoderNAT SEMICONDUCTOR CORP·Filed 1995·Granted Jul 23, 1996·30 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →