Inventor · disambiguated record
James E. Nulty
Also filed as: NULTY JAMES · NULTY JAMES E
18 granted patents·962 citations·filing 1989–2008
96Inventor score
Top patents by PatentIndex Score
18 records- 0196US5468342AMethod of etching an oxide layerCYPRESS SEMICONDUCTOR CORP·Filed 1994·Granted Nov 21, 1995·383 cites·63 claims
- 0294US5562801AMethod of etching an oxide layerCYPRESS SEMICONDUCTOR CORP·Filed 1994·Granted Oct 8, 1996·214 cites·14 claims
- 0384US5045149AMethod and apparatus for end point detectionVLSI TECHNOLOGY INC·Filed 1990·Granted Sep 3, 1991·46 cites·10 claims
- 0484US4954212AEndpoint detection system and method for plasma etchingVLSI TECHNOLOGY INC·Filed 1989·Granted Sep 4, 1990·32 cites·12 claims
- 0583US7332921B2Probe card and method for constructing sameCYPRESS SEMICONDUCTOR CORP·Filed 2005·Granted Feb 19, 2008·12 cites·14 claims
- 0682US6847218B1Probe card with an adapter layer for testing integrated circuitsCYPRESS SEMICONDUCTOR CORP·Filed 2002·Granted Jan 25, 2005·36 cites·15 claims
- 0778US5013400ADry etch process for forming champagne profiles, and dry etch apparatusGEN SIGNAL CORP·Filed 1990·Granted May 7, 1991·90 cites·33 claims
- 0871US6784552B2Structure having reduced lateral spacer erosionCYPRESS SEMICONDUCTOR CORP·Filed 2000·Granted Aug 31, 2004·12 cites·12 claims
- 0968US6066555AMethod for eliminating lateral spacer erosion on enclosed contact topographies during RF sputter cleaningCYPRESS SEMICONDUCTOR CORP·Filed 1995·Granted May 23, 2000·30 cites·28 claims
- 1065US6406640B1Plasma etching methodCYPRESS SEMICONDUCTOR CORP·Filed 2000·Granted Jun 18, 2002·9 cites·14 claims
- 1165US5441596AMethod for forming a stable plasmaCYPRESS SEMICONDUCTOR CORP·Filed 1994·Granted Aug 15, 1995·29 cites·36 claims
- 1262US7112975B1Advanced probe card and method of fabricating sameCYPRESS SEMICONDUCTOR CORP·Filed 2004·Granted Sep 26, 2006·8 cites·16 claims
- 1361US6372634B1Plasma etch chemistry and method of improving etch controlCYPRESS SEMICONDUCTOR CORP·Filed 1999·Granted Apr 16, 2002·26 cites·29 claims
- 1460US7685705B2Method of fabricating a probe cardCYPRESS SEMICONDUCTOR CORP·Filed 2008·Granted Mar 30, 2010·2 cites·9 claims
- 1547US6165375APlasma etching methodCYPRESS SEMICONDUCTOR CORP·Filed 1997·Granted Dec 26, 2000·12 cites·15 claims
- 1644US6373679B1Electrostatic or mechanical chuck assembly conferring improved temperature uniformity onto workpieces held thereby, workpiece processing technology and/or apparatus containing the same, and method(s) for holding and/or processing a workpiece with the sameCYPRESS SEMICONDUCTOR CORP·Filed 1999·Granted Apr 16, 2002·11 cites·20 claims
- 1737US6214743B1Method and structure for making self-aligned contactsCYPRESS SEMICONDUCTOR CORP·Filed 1999·Granted Apr 10, 2001·10 cites·20 claims
- 1829US6890860B1Method for etching and/or patterning a silicon-containing layerCYPRESS SEMICONDUCTOR CORP·Filed 1999·Granted May 10, 2005·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →