Inventor · disambiguated record
Jaroslaw Paluszynski
Also filed as: PALUSZYNSKI JAROSLAW
6 granted patents·28 citations·filing 2011–2013
78Inventor score
Technology areasH01J
Top patents by PatentIndex Score
6 records- 0187US8227752B1Method of operating a scanning electron microscopeMANTZ HUBERT·Filed 2011·Granted Jul 24, 2012·16 cites·22 claims
- 0272US8487252B2Particle beam microscope and method for operating the particle beam microscopeDIEMER SIMON·Filed 2011·Granted Jul 16, 2013·5 cites·26 claims
- 0370US9536704B2Method for avoiding artefacts during serial block face imagingZEISS CARL MICROSCOPY GMBH·Filed 2013·Granted Jan 3, 2017·3 cites·24 claims
- 0470US8766219B2Particle beam microscope for generating material dataZEISS CARL MICROSCOPY GMBH·Filed 2013·Granted Jul 1, 2014·2 cites·23 claims
- 0561US8816303B2Method of processing of an objectBIBERGER JOSEF·Filed 2011·Granted Aug 26, 2014·2 cites·40 claims
- 0641US9035247B2Method for operating a particle beam device and/or for analyzing an object in a particle beam deviceZEISS CARL MICROSCOPY GMBH·Filed 2013·Granted May 19, 2015·0 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →