Inventor · disambiguated record
Jae-Kwan Park
Also filed as: PARK JAE-KWAN
55 granted patents·7 pending applications·435 citations·filing 1995–2022
98Inventor score
Files withSAMSUNG ELECTRONICS CO LTD24MICRON TECHNOLOGY INC17PARK JANG-HO4PARK SANG-YONG4LEE YOUNG-HO3
Top patents by PatentIndex Score
62 records- 0195US9691452B2Apparatuses and methods for concurrently accessing different memory planes of a memoryMICRON TECHNOLOGY INC·Filed 2014·Granted Jun 27, 2017·15 cites·34 claims
- 0295US7885114B2NAND flash memory devices having wiring with integrally-formed contact pads and dummy lines and methods of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Feb 8, 2011·28 cites·14 claims
- 0394US7544565B2Semiconductor devices having a convex active region and methods of forming the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jun 9, 2009·30 cites·17 claims
- 0493US8216947B2Methods of forming fine patterns in integrated circuit devicesLEE YOUNG-HO·Filed 2009·Granted Jul 10, 2012·22 cites·20 claims
- 0592US9443610B1Leakage current detectionMICRON TECHNOLOGY INC·Filed 2015·Granted Sep 13, 2016·19 cites·23 claims
- 0691US10083727B2Apparatuses and methods for concurrently accessing different memory planes of a memoryMICRON TECHNOLOGY INC·Filed 2017·Granted Sep 25, 2018·7 cites·18 claims
- 0791US9870280B2Apparatuses and methods for comparing a current representative of a number of failing memory cellsMICRON TECHNOLOGY INC·Filed 2016·Granted Jan 16, 2018·5 cites·20 claims
- 0890US9117654B2Methods of forming fine patterns in integrated circuit devicesLEE YOUNG-HO·Filed 2012·Granted Aug 25, 2015·9 cites·18 claims
- 0990US7626228B2NAND-type non-volatile memory devices having a stacked structureSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Dec 1, 2009·18 cites·5 claims
- 1089US9672875B2Methods and apparatuses for providing a program voltage responsive to a voltage determinationMICRON TECHNOLOGY INC·Filed 2014·Granted Jun 6, 2017·9 cites·22 claims
- 1187US10755755B2Apparatuses and methods for concurrently accessing different memory planes of a memoryMICRON TECHNOLOGY INC·Filed 2018·Granted Aug 25, 2020·5 cites·8 claims
- 1287US8339859B2Nonvolatile memory devices that utilize dummy word line segments to inhibit dishing during fabricationPARK JANG-HO·Filed 2012·Granted Dec 25, 2012·5 cites·20 claims
- 1386US8673782B2Methods of manufacturing NAND flash memory devicesPARK JANG-HO·Filed 2012·Granted Mar 18, 2014·5 cites·11 claims
- 1486US8213231B2NAND flash memory devices having wiring with integrally-formed contact pads and dummy lines and methods of manufacturing the samePARK JANG-HO·Filed 2011·Granted Jul 3, 2012·5 cites·20 claims
- 1586US8057692B2Methods of forming fine patterns in the fabrication of semiconductor devicesPARK SANG-YONG·Filed 2008·Granted Nov 15, 2011·9 cites·25 claims
- 1686US7880531B2System, apparatus, and method for selectable voltage regulationMICRON TECHNOLOGY INC·Filed 2008·Granted Feb 1, 2011·21 cites·25 claims
- 1784US9349420B2Apparatuses and methods for comparing a current representative of a number of failing memory cellsMICRON TECHNOLOGY INC·Filed 2014·Granted May 24, 2016·4 cites·21 claims
- 1884US8357605B2Methods of fabricating semiconductor memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2011·Granted Jan 22, 2013·7 cites·20 claims
- 1983US7968447B2Semiconductor device and methods of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Jun 28, 2011·8 cites·14 claims
- 2082US9530470B2Method and apparatus for pre-charging data lines in a memory cell arrayMICRON TECHNOLOGY INC·Filed 2015·Granted Dec 27, 2016·5 cites·18 claims
- 2182US7723775B2NAND flash memory device having a contact for controlling a well potentialSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted May 25, 2010·8 cites·18 claims
- 2281US8901746B2Methods of manufacturing NAND flash memory devicesPARK JANG-HO·Filed 2014·Granted Dec 2, 2014·3 cites·23 claims
- 2381US8854898B2Apparatuses and methods for comparing a current representative of a number of failing memory cellsPARK JAE-KWAN·Filed 2011·Granted Oct 7, 2014·5 cites·25 claims
- 2480US11462250B2Apparatuses and methods for concurrently accessing different memory planes of a memoryMICRON TECHNOLOGY INC·Filed 2020·Granted Oct 4, 2022·1 cites·20 claims
- 2580US8178442B2Method of forming patterns of semiconductor devicePARK SANG-YONG·Filed 2009·Granted May 15, 2012·9 cites·20 claims
- 2678US7816270B2Method of forming minute patterns in semiconductor device using double patterningSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Oct 19, 2010·5 cites·12 claims
- 2776US11955204B2Apparatuses and methods for concurrently accessing different memory planes of a memoryMICRON TECHNOLOGY INC·Filed 2022·Granted Apr 9, 2024·0 cites·20 claims
- 2876US10127988B2Temperature compensation in memory sensingMICRON TECHNOLOGY INC·Filed 2016·Granted Nov 13, 2018·4 cites·26 claims
- 2975US9633744B2On demand knockout of coarse sensing based on dynamic source bounce detectionINTEL CORP·Filed 2015·Granted Apr 25, 2017·4 cites·29 claims
- 3074US9093454B2Semiconductor devices having fine patternsSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Jul 28, 2015·2 cites·16 claims
- 3174US7419909B2Methods of forming a semiconductor device that allow patterns in different regions that have different pitches to be connectedSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Sep 2, 2008·5 cites·14 claims
- 3273US9947375B2Methods and apparatuses for providing a program voltage responsive to a voltage determinationMICRON TECHNOLOGY INC·Filed 2017·Granted Apr 17, 2018·2 cites·20 claims
- 3372US5840591AMethod of manufacturing buried bit line DRAM cellSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Nov 24, 1998·34 cites·6 claims
- 3471US8902660B2Semiconductor devices having wiring with contact pads and dummy linesSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Dec 2, 2014·1 cites·18 claims
- 3571US6865110B1Program voltage generation circuit for stably programming flash memory cell and method of programming flash memory cellSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Mar 8, 2005·18 cites·8 claims
- 3671US5787038AFlash memory deviceHYUNDAI ELECTRONICS IND·Filed 1996·Granted Jul 28, 1998·31 cites·3 claims
- 3770US8686563B2Methods of forming fine patterns in the fabrication of semiconductor devicesPARK SANG-YONG·Filed 2009·Granted Apr 1, 2014·2 cites·20 claims
- 3868US10095574B2Apparatuses and methods for comparing a current representative of a number of failing memory cellsMICRON TECHNOLOGY INC·Filed 2017·Granted Oct 9, 2018·1 cites·20 claims
- 3966US8173549B2Methods of forming semiconductor device patternsLEE YOUNG-HO·Filed 2009·Granted May 8, 2012·3 cites·20 claims
- 4065US10318372B2Apparatuses and methods for comparing a current representative of a number of failing memory cellsMICRON TECHNOLOGY INC·Filed 2018·Granted Jun 11, 2019·0 cites·20 claims
- 4164US7772069B2Methods of forming a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Aug 10, 2010·2 cites·22 claims
- 4262US8314457B2Non-volatile memory devicesKIM HYUN-SUK·Filed 2011·Granted Nov 20, 2012·1 cites·7 claims
- 4360US5866927AIntegrated circuit devices having contact pads which are separated by sidewall spacersSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Feb 2, 1999·24 cites·9 claims
- 4453US9030884B2Method and apparatus for pre-charging data lines in a memory cell arrayPARK JAE-KWAN·Filed 2011·Granted May 12, 2015·1 cites·28 claims
- 4552US7973357B2Non-volatile memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Jul 5, 2011·0 cites·9 claims
- 4652US2009236651A1Semiconductor devices having a convex active regionKWAK DONG HWA·Filed 2009·Application pending·0 cites
- 4751US10366728B2Methods and apparatuses for providing a program voltage responsive to a voltage determinationMICRON TECHNOLOGY INC·Filed 2018·Granted Jul 30, 2019·0 cites·20 claims
- 4850US7842571B2Method for forming semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Nov 30, 2010·0 cites·14 claims
- 4948US6248636B1Method for forming contact holes of semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Jun 19, 2001·13 cites·20 claims
- 5047US8114778B2Method of forming minute patterns in semiconductor device using double patterningPARK SANG-YONG·Filed 2010·Granted Feb 14, 2012·0 cites·8 claims
Showing the top 50 of 62 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →