Inventor · disambiguated record
Jang-Ik Park
Also filed as: PARK JANG-IK
10 granted patents·5 pending applications·39 citations·filing 2005–2024
83Inventor score
Files withSAMSUNG ELECTRONICS CO LTD8DONG YANG PISTON CO LTD2DAELYUN ENG CO LTD1OCEAN US CO LTD1PARK JAE-WOO1
Top patents by PatentIndex Score
15 records- 0195US9417180B2Optical measuring methods and systemSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Aug 16, 2016·29 cites·20 claims
- 0272US9255789B2Method for measuring thickness of objectSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Feb 9, 2016·3 cites·20 claims
- 0364US9593940B2Optical measuring methods and apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Mar 14, 2017·1 cites·19 claims
- 0460US11340013B2Apparatus for liquefying natural gas and method for liquefying natural gasSUNG IL ENCARE CO LTD·Filed 2018·Granted May 24, 2022·1 cites·8 claims
- 0558US10060327B2Piston for internal combustion engine, and cooling channel coreDONG YANG PISTON CO LTD·Filed 2016·Granted Aug 28, 2018·1 cites·7 claims
- 0658US7197426B2Method and apparatus for measuring thickness of metal layerSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Mar 27, 2007·3 cites·20 claims
- 0754US2024400161A1Elevation system and vessel having a sameDAELYUN ENG CO LTD·Filed 2024·Application pending·0 cites
- 0849US8551791B2Apparatus and method for manufacturing semiconductor devices through layer material dimension analysisPARK JANG-IK·Filed 2009·Granted Oct 8, 2013·1 cites·20 claims
- 0946US2008186472A1Apparatus and method for inspecting a waferPARK JAE-WOO·Filed 2008·Application pending·0 cites
- 1045US10760526B2Piston for internal combustion engineDONG YANG PISTON CO LTD·Filed 2019·Granted Sep 1, 2020·0 cites·10 claims
- 1141US2007184565A1Test pattern and method for measuring silicon etching depthSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 1240US10410937B2Optical measuring method for semiconductor wafer including a plurality of patterns and method of manufacturing semiconductor device using optical measurementSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Sep 10, 2019·0 cites·20 claims
- 1340US9919770B2Mooring apparatus for offshore constructionOCEAN US CO LTD·Filed 2014·Granted Mar 20, 2018·0 cites·9 claims
- 1438US2020182777A1Substrate inspection apparatus, method of calibrating the substrate inspection apparatus, and method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Application pending·0 cites
- 1531US2015355108A1Inspection system and methods of fabricating and inspecting semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →