Inventor · disambiguated record
James V. Rhodes
Also filed as: RHODES JAMES · RHODES JAMES V · RHODES JAMES VERNON
25 granted patents·3 pending applications·397 citations·filing 1983–2020
96Inventor score
Top patents by PatentIndex Score
28 records- 0190US9332609B1Phase cut dimming LED driverIllum Technology LLC·Filed 2015·Granted May 3, 2016·47 cites·8 claims
- 0288US5557559AUniversal burn-in driver system and method thereforMOTAY ELECTRONICS INC·Filed 1993·Granted Sep 17, 1996·72 cites·60 claims
- 0387US5390129AUniversal burn-in driver system and method thereforMOTAY ELECTRONICS INC·Filed 1992·Granted Feb 14, 1995·71 cites·107 claims
- 0483US10178730B2Method and apparatus for horticultural lighting with current sharingILLUM TECH LLC·Filed 2017·Granted Jan 8, 2019·3 cites·12 claims
- 0582US10512132B2Method and apparatus for horticultural lighting with current sharingILLUM TECH LLC·Filed 2019·Granted Dec 17, 2019·3 cites·14 claims
- 0680US10034342B2Method and apparatus for an indoor horticultural facilityILLUM TECH LLC·Filed 2017·Granted Jul 24, 2018·3 cites·20 claims
- 0774US11268673B2Method and apparatus for an adaptable vehicle light fixtureILIUM TECH LLC·Filed 2020·Granted Mar 8, 2022·1 cites·17 claims
- 0872US10028350B2Method and apparatus for horticultural lighting with enhanced dimming and optimized efficiencyILLUM TECH LLC·Filed 2017·Granted Jul 17, 2018·1 cites·20 claims
- 0969US6958617B1Electromechanical module, for holding IC-chips in a chip testing system, that synchronizes and translates test signals to the IC-chipsUNISYS CORP·Filed 2004·Granted Oct 25, 2005·14 cites·11 claims
- 1069US6363510B1Electronic system for testing chips having a selectable number of pattern generators that concurrently broadcast different bit streams to selectable sets of chip driver circuitsUNISYS CORP·Filed 1999·Granted Mar 26, 2002·32 cites·11 claims
- 1166US6415409B1System for testing IC chips selectively with stored or internally generated bit streamsUNISYS CORP·Filed 1999·Granted Jul 2, 2002·29 cites·10 claims
- 1263US6924636B2System for testing one or more groups of IC-chips while concurrently loading/unloading another groupUNISYS CORP·Filed 2003·Granted Aug 2, 2005·11 cites·14 claims
- 1363US6571365B1Initial stage of a multi-stage algorithmic pattern generator for testing IC chipsUNISYS CORP·Filed 1999·Granted May 27, 2003·25 cites·8 claims
- 1459US9648686B2LED device with power removal detection and method for using the sameJST PERFORMANCE LLC·Filed 2014·Granted May 9, 2017·0 cites·20 claims
- 1558US2009150208A1Method and apparatus for integrated inventory and planningRHODES JAMES·Filed 2008·Application pending·0 cites
- 1653US6985849B1System and method for portable emulation of operating environmentIOMEGA CORP·Filed 2001·Granted Jan 10, 2006·7 cites·3 claims
- 1753US6477676B1Intermediate stage of a multi-stage algorithmic pattern generator for testing IC chipsUNISYS CORP·Filed 1999·Granted Nov 5, 2002·15 cites·14 claims
- 1852US10244610B2Method and apparatus for an intelligent lighting systemILLUM TECH LLC·Filed 2018·Granted Mar 26, 2019·0 cites·18 claims
- 1952US6919718B2System for testing a group of IC-chips having a chip holding subassembly that is built-in and loaded/unloaded automaticallyUNISYS CORP·Filed 2003·Granted Jul 19, 2005·6 cites·12 claims
- 2052US6415408B1Multi-stage algorithmic pattern generator for testing IC chipsUNISYS CORP·Filed 1999·Granted Jul 2, 2002·16 cites·12 claims
- 2150US6909299B1System for testing multiple groups of IC-chips which concurrently sends time-shifted test signals to the groupsUNISYS CORP·Filed 2003·Granted Jun 21, 2005·5 cites·12 claims
- 2249US10652976B2Method and apparatus for monitoring and commanding lighting systems and their associated controlsILLUM TECH LLC·Filed 2018·Granted May 12, 2020·0 cites·18 claims
- 2346US6363504B1Electronic system for testing a set of multiple chips concurrently or sequentially in selectable subsets under program control to limit chip power dissipationUNISYS CORP·Filed 1999·Granted Mar 26, 2002·13 cites·11 claims
- 2444US6480981B1Output stage of a multi-stage algorithmic pattern generator for testing IC chipsUNISYS CORP·Filed 1999·Granted Nov 12, 2002·11 cites·15 claims
- 2543US4527015ASecurity listening systemCHAMBERS COLIN T·Filed 1983·Granted Jul 2, 1985·10 cites·4 claims
- 2638US2013002168A1Programmable solid state illuminating system and the controlling method thereofVERDE DESIGNS INC·Filed 2011·Application pending·0 cites
- 2736US2006052999A1System and method for portable emulation of operating environmentBROOKS NEAL·Filed 2005·Application pending·0 cites
- 2829US6405150B1Program storage device containing instructions that are spaced apart by unused bits that end on word boundaries and which generate chip testing bit streams of any lengthUNISYS CORP·Filed 1999·Granted Jun 11, 2002·2 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →