Inventor · disambiguated record
James D. Sansbury
Also filed as: SANSBURY JAMES D
31 granted patents·1,284 citations·filing 1978–2003
98Inventor score
Top patents by PatentIndex Score
31 records- 0199US5949710AProgrammable interconnect junctionALTERA CORP·Filed 1996·Granted Sep 7, 1999·191 cites·48 claims
- 0298US6005806ANonvolatile configuration cells and cell arraysALTERA CORP·Filed 1996·Granted Dec 21, 1999·139 cites·24 claims
- 0397US5581501ANonvolatile SRAM cells and cell arraysALTERA CORP·Filed 1995·Granted Dec 3, 1996·186 cites·25 claims
- 0496US6320788B1Programmable impedance deviceSANDISK CORP·Filed 2000·Granted Nov 20, 2001·98 cites·12 claims
- 0594US5200920AMethod for programming programmable elements in programmable devicesALTERA CORP·Filed 1991·Granted Apr 6, 1993·142 cites·30 claims
- 0693US6031763AEvaluation of memory cell characteristicsALTERA CORP·Filed 1999·Granted Feb 29, 2000·85 cites·17 claims
- 0793US6018476ANonvolatile configuration cells and cell arraysALTERA CORP·Filed 1997·Granted Jan 25, 2000·96 cites·22 claims
- 0886US5812450ANonvolatile SRAM cells and cell arraysALTERA CORP·Filed 1996·Granted Sep 22, 1998·48 cites·44 claims
- 0984US6201734B1Programmable impedance deviceSANDISK CORP·Filed 1998·Granted Mar 13, 2001·41 cites·30 claims
- 1077US6243296B1Compact electrically erasable memory cells and arraysALTERA CORP·Filed 1999·Granted Jun 5, 2001·33 cites·23 claims
- 1176US6532170B1Nonvolatile configuration cells and cell arraysALTERA CORP·Filed 2001·Granted Mar 11, 2003·11 cites·32 claims
- 1273US6122209AMethod of margin testing programmable interconnect cellALTERA CORP·Filed 1999·Granted Sep 19, 2000·18 cites·15 claims
- 1369US6646919B1Apparatus and method for margin testing single polysilicon EEPROM cellsALTERA CORP·Filed 2001·Granted Nov 11, 2003·14 cites·9 claims
- 1467US5905675ABiasing scheme for reducing stress and improving reliability in EEPROM cellsALTERA CORP·Filed 1997·Granted May 18, 1999·26 cites·19 claims
- 1565US6295230B1Nonvolatile configuration cells and cell arraysALTERA COPORATION·Filed 1999·Granted Sep 25, 2001·15 cites·29 claims
- 1664US6366498B1Nonvolatile configuration cells and cell arraysALTERA CORP·Filed 1999·Granted Apr 2, 2002·11 cites·23 claims
- 1763US6573138B1Nonvolatile memory cell with low doping regionALTERA CORP·Filed 1999·Granted Jun 3, 2003·12 cites·42 claims
- 1860US5959891AEvaluation of memory cell characteristicsALTERA CORP·Filed 1997·Granted Sep 28, 1999·14 cites·10 claims
- 1957US6282122B1Evaluation of memory cell characteristicsALTERA CORP·Filed 1999·Granted Aug 28, 2001·12 cites·24 claims
- 2057US6078521ANonvolatile configuration cells and cell arraysALTERA CORP·Filed 1999·Granted Jun 20, 2000·14 cites·9 claims
- 2157US6028787ANonvolatile static memory circuitALTERA CORP·Filed 1998·Granted Feb 22, 2000·12 cites·23 claims
- 2255US6828620B2Nonvolatile memory cell with low doping regionALTERA CORP·Filed 2003·Granted Dec 7, 2004·4 cites·16 claims
- 2355US6226201B1Techniques to configure nonvolatile cells and cell arraysALTERA CORP·Filed 1998·Granted May 1, 2001·9 cites·21 claims
- 2454US6052309ANonvolatile configuration cells and cell arraysALTERA CORP·Filed 1999·Granted Apr 18, 2000·7 cites·6 claims
- 2552US6442073B1Nonvolatile memory cell with multiple gate oxide thicknessesALTERA CORP·Filed 2001·Granted Aug 27, 2002·6 cites·33 claims
- 2652US5914904ACompact electrically erasable memory cells and arraysALTERA CORP·Filed 1997·Granted Jun 22, 1999·11 cites·39 claims
- 2750US6456529B1Programmable impedance deviceSANDISK CORP·Filed 2001·Granted Sep 24, 2002·4 cites·14 claims
- 2848US4320312ASmaller memory cells and logic circuitsHEWLETT PACKARD CO·Filed 1978·Granted Mar 16, 1982·7 cites·6 claims
- 2946US6268623B1Apparatus and method for margin testing single polysilicon EEPROM cellsALTERA CORP·Filed 1997·Granted Jul 31, 2001·9 cites·13 claims
- 3041US6236597B1Nonvolatile memory cell with multiple gate oxide thicknessesALTERA CORP·Filed 1998·Granted May 22, 2001·6 cites·56 claims
- 3140US6781883B1Apparatus and method for margin testing single polysilicon EEPROM cellsALTERA CORP·Filed 2003·Granted Aug 24, 2004·3 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →