Inventor · disambiguated record
Jacob Savir
Also filed as: SAVIR JACOB
4 granted patents·211 citations·filing 1991–1994
81Inventor score
Files withIBM4
Top patents by PatentIndex Score
4 records- 0189US5642362AScan-based delay tests having enhanced test vector pattern generationIBM·Filed 1994·Granted Jun 24, 1997·100 cites·18 claims
- 0286US5394405AUniversal weight generatorIBM·Filed 1992·Granted Feb 28, 1995·72 cites·1 claims
- 0361US5278842ADelay test coverage enhancement for logic circuitry employing level sensitive scan designIBM·Filed 1991·Granted Jan 11, 1994·22 cites·4 claims
- 0452US5442640ATest and diagnosis of associated output logic for products having embedded arraysIBM·Filed 1994·Granted Aug 15, 1995·17 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →