Inventor · disambiguated record
Jae-Gyun Shim
Also filed as: SHIM JAE GYUN
23 granted patents·1 pending application·204 citations·filing 2000–2011
95Inventor score
Top patents by PatentIndex Score
24 records- 0192US7954869B2Pick and place apparatusTECHWING CO LTD·Filed 2006·Granted Jun 7, 2011·23 cites·18 claims
- 0292US7948255B2Test handlerTECHWING CO LTD·Filed 2006·Granted May 24, 2011·18 cites·3 claims
- 0389US8141922B2Pick-and-place apparatusSHIM JAE-GYUN·Filed 2007·Granted Mar 27, 2012·17 cites·6 claims
- 0487US8038191B2Pick and place apparatusTECHWING CO LTD·Filed 2008·Granted Oct 18, 2011·13 cites·9 claims
- 0583US6844717B2Test handlerTECHWING CO LTD·Filed 2001·Granted Jan 18, 2005·32 cites·19 claims
- 0680US7538542B2Test handler and operation method thereofTECHWING CO LTD·Filed 2006·Granted May 26, 2009·6 cites·9 claims
- 0780US6346682B2Rambus handlerSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Feb 12, 2002·37 cites·37 claims
- 0879US6651817B2Test tray insert of test handlerTECHWING CO LTD·Filed 2001·Granted Nov 25, 2003·24 cites·6 claims
- 0977US8154314B2Side-docking type test handler and apparatus for transferring test tray for sameSHIM JAE GYUN·Filed 2009·Granted Apr 10, 2012·7 cites·5 claims
- 1075US7667453B2Test tray for test handlerTECHWING CO LTD·Filed 2008·Granted Feb 23, 2010·2 cites·14 claims
- 1174US7557564B2Test handler comprising at least one opening unit opening one part of the plurality of insertsTECHWING CO LTD·Filed 2007·Granted Jul 7, 2009·4 cites·10 claims
- 1270US8258804B2Test tray for test handlerSHIM JAE-GYUN·Filed 2007·Granted Sep 4, 2012·3 cites·7 claims
- 1369US7656150B2Test handler and loading method thereofTECHWING CO LTD·Filed 2007·Granted Feb 2, 2010·5 cites·7 claims
- 1467US8026735B2Test handlerTECHWING CO LTD·Filed 2009·Granted Sep 27, 2011·2 cites·2 claims
- 1566US7723981B2Method for transferring test trays in a side-docking type test handlerTECHWING CO LTD·Filed 2009·Granted May 25, 2010·2 cites·7 claims
- 1664US8653845B2Test handler and method for operating the same for testing semiconductor devicesSHIM JAE-GYUN·Filed 2011·Granted Feb 18, 2014·1 cites·3 claims
- 1764US7898271B2Position changing apparatus for test handler and power transferring apparatusTECHWING CO LTD·Filed 2009·Granted Mar 1, 2011·1 cites·10 claims
- 1862US8013620B2Test handler and loading method thereofTECHWING CO LTD·Filed 2009·Granted Sep 6, 2011·3 cites·3 claims
- 1958US7923989B2Test handlerTECHWING CO LTD·Filed 2008·Granted Apr 12, 2011·2 cites·6 claims
- 2058US7816910B2Test handler having size-changeable test siteTECHWING CO LTD·Filed 2009·Granted Oct 19, 2010·2 cites·24 claims
- 2151US8159252B2Test handler and method for operating the same for testing semiconductor devicesSHIM JAE-GYUN·Filed 2007·Granted Apr 17, 2012·0 cites·3 claims
- 2249US8058890B2Test HandlerSHIM JAE-GYUN·Filed 2011·Granted Nov 15, 2011·0 cites·2 claims
- 2342US2008191687A1Test Handler Having Size-Changeable Test SiteTECHWING CO LTD·Filed 2006·Application pending·0 cites
- 2431US8919755B2Hi-fix board clamping apparatus for use in test handlerSHIM JAE GYUN·Filed 2007·Granted Dec 30, 2014·0 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →