Inventor · disambiguated record
Jan Sijbers
Also filed as: SIJBERS JAN · SIJBERS JAN JOZEF MARIA
13 granted patents·24 citations·filing 2010–2022
86Inventor score
Top patents by PatentIndex Score
13 records- 0179US10520452B2Automated quality control and selectionUNIV LEUVEN KATH·Filed 2016·Granted Dec 31, 2019·8 cites·20 claims
- 0274US9996951B2Computerized tomographic image exposure and reconstruction methodAGFA HEALTHCARE·Filed 2015·Granted Jun 12, 2018·3 cites·13 claims
- 0367US8933932B2Method for mapping tubular surfaces to a cylinderHUYSMANS TOON·Filed 2010·Granted Jan 13, 2015·5 cites·23 claims
- 0466US10481587B2OrthosisUNIV ANTWERPEN·Filed 2016·Granted Nov 19, 2019·2 cites·10 claims
- 0561US9619902B2Filter for tomographic reconstructionsBATENBURG KEES JOOST·Filed 2012·Granted Apr 11, 2017·4 cites·19 claims
- 0661US9373180B2Dynamic tomography angle selectionUNIV ANTWERPEN·Filed 2012·Granted Jun 21, 2016·2 cites·14 claims
- 0757US12471862B2Phase-contrast X-ray imaging system for obtaining a dark-field image and a method thereforIMEC VZW·Filed 2022·Granted Nov 18, 2025·0 cites·15 claims
- 0851US11927586B2Item inspection by radiation imaging using an iterative projection-matching approachUNIV ANTWERPEN·Filed 2019·Granted Mar 12, 2024·0 cites·16 claims
- 0950US12500062B2Reconstruction method for atom probe tomographyUNIV ANTWERPEN·Filed 2021·Granted Dec 16, 2025·0 cites·15 claims
- 1049US11953451B2Item inspection by dynamic selection of projection angleUNIV ANTWERPEN·Filed 2019·Granted Apr 9, 2024·0 cites·20 claims
- 1141US12350008B2Determination of parametrized characteristics of a tissueIMEC VZW·Filed 2019·Granted Jul 8, 2025·0 cites·12 claims
- 1241US10945682B2Geometric misalignment correction method for chest tomosynthesis reconstructionAGFA HEALTHCARE NV·Filed 2017·Granted Mar 16, 2021·0 cites·15 claims
- 1341US10859511B2Mobile imaging of an object using penetrating radiationUNIV ANTWERPEN·Filed 2017·Granted Dec 8, 2020·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →