Inventor · disambiguated record
James Stronski
Also filed as: STRONSKI JAMES · STRONSKI JAMES P · STRONSKI JAMES PETER
7 granted patents·1 pending application·236 citations·filing 1993–2016
88Inventor score
Technology areasG01N
Files withGAMMA METRICS3SWISHER INT INC2KING EDWARD TECHNOLOGY INC1SHYU CHAUR-MING1THERMO GAMMA METRICS LLC1
Top patents by PatentIndex Score
8 records- 0194USD485639SCigar tipKING EDWARD TECHNOLOGY INC·Filed 2003·Granted Jan 20, 2004·124 cites·1 claims
- 0281US5396071AModularized assembly for bulk material analyzerGAMMA METRICS·Filed 1993·Granted Mar 7, 1995·55 cites·11 claims
- 0370US7667838B2In-stream spectroscopic elemental analysis of particles being conducted within a gaseous streamTHERMO GAMMA METRICS LLC·Filed 2006·Granted Feb 23, 2010·8 cites·14 claims
- 0469USD779339SCigar packageSWISHER INT INC·Filed 2015·Granted Feb 21, 2017·12 cites·1 claims
- 0565USD791585SCigar packageSWISHER INT INC·Filed 2016·Granted Jul 11, 2017·9 cites·1 claims
- 0653US6157034AFlexible multi-purpose modular assembly for a family of PGNAA bulk material analyzersGAMMA METRICS·Filed 1998·Granted Dec 5, 2000·20 cites·54 claims
- 0740USRE36943EModularized assembly for bulk material analyzerGAMMA METRICS·Filed 1997·Granted Nov 7, 2000·8 cites·13 claims
- 0838US2004262509A1Calibration of material analyzer and/or validation of said calibration with calibration/reference standard componentsSHYU CHAUR-MING·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →