Inventor · disambiguated record
James C. Tsang
Also filed as: TSANG JAMES · TSANG JAMES C · TSANG JAMES CHEN-HSIANG
18 granted patents·496 citations·filing 1990–2010
95Inventor score
Top patents by PatentIndex Score
18 records- 0197US5940545ANoninvasive optical method for measuring internal switching and other dynamic parameters of CMOS circuitsIBM·Filed 1996·Granted Aug 17, 1999·190 cites·31 claims
- 0292US8927057B2Graphene formation utilizing solid phase carbon sourcesBOL AGEETH A·Filed 2010·Granted Jan 6, 2015·14 cites·13 claims
- 0385US7577233B1Rotating X-ray apparatus for inspection of deployed intravascular devicesGLENBROOK TECHNOLOGIES INC·Filed 2007·Granted Aug 18, 2009·16 cites·8 claims
- 0485US6515304B1Device for defeating reverse engineering of integrated circuits by optical meansIBM·Filed 2000·Granted Feb 4, 2003·26 cites·30 claims
- 0580US6496022B1Method and apparatus for reverse engineering integrated circuits by monitoring optical emissionIBM·Filed 1999·Granted Dec 17, 2002·46 cites·8 claims
- 0679US7115916B2System and method for molecular optical emissionIBM·Filed 2002·Granted Oct 3, 2006·38 cites·6 claims
- 0773US7115912B2Device for defeating reverse engineering of integrated circuits by optical meansIBM·Filed 2002·Granted Oct 3, 2006·11 cites·4 claims
- 0871US7791087B2Device for defeating reverse engineering of integrated circuits by optical meansIBM·Filed 2009·Granted Sep 7, 2010·2 cites·3 claims
- 0971US7781782B2Device for defeating reverse engineering of integrated circuits by optical meansIBM·Filed 2009·Granted Aug 24, 2010·2 cites·3 claims
- 1070US7791086B2Device for defeating reverse engineering of integrated circuits by optical meansIBM·Filed 2009·Granted Sep 7, 2010·2 cites·3 claims
- 1170US7612382B2Method for defeating reverse engineering of integrated circuits by optical meansIBM·Filed 2008·Granted Nov 3, 2009·2 cites·12 claims
- 1270US7399992B2Device for defeating reverse engineering of integrated circuits by optical meansIBM·Filed 2006·Granted Jul 15, 2008·2 cites·8 claims
- 1369US5278758AMethod and apparatus for nuclear logging using lithium detector assemblies and gamma ray stripping meansBAKER HUGHES INC·Filed 1990·Granted Jan 11, 1994·42 cites·48 claims
- 1467US6172512B1Image processing methods for the optical detection of dynamic errors in integrated circuitsIBM·Filed 1998·Granted Jan 9, 2001·29 cites·11 claims
- 1561US6774647B2Noninvasive optical method and system for inspecting or testing CMOS circuitsIBM·Filed 2002·Granted Aug 10, 2004·9 cites·20 claims
- 1661US6327394B1Apparatus and method for deriving temporal delays in integrated circuitsIBM·Filed 1998·Granted Dec 4, 2001·23 cites·19 claims
- 1761US6028952ASystem and method for compressing and analyzing time-resolved optical data obtained from operating integrated circuitsIBM·Filed 1998·Granted Feb 22, 2000·22 cites·18 claims
- 1858US6650768B1Using time resolved light emission from VLSI circuit devices for navigation on complex systemsIBM·Filed 1998·Granted Nov 18, 2003·20 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →