Inventor · disambiguated record
Jari Vahe
Also filed as: VAHE JARI · VAHE JARI JUHANI
5 granted patents·101 citations·filing 2003–2015
81Inventor score
Top patents by PatentIndex Score
5 records- 0190US6904375B1Method and circuits for testing high speed devices using low speed ATE testersXILINX INC·Filed 2003·Granted Jun 7, 2005·58 cites·30 claims
- 0283US7420384B1Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfacesXILINX INC·Filed 2006·Granted Sep 2, 2008·12 cites·20 claims
- 0378US7071679B1Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfacesXILINX INC·Filed 2003·Granted Jul 4, 2006·24 cites·11 claims
- 0475US7301327B1Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfacesXILINX INC·Filed 2006·Granted Nov 27, 2007·6 cites·9 claims
- 0558US9503138B2Interference cancellationMARVELL WORLD TRADE LTD·Filed 2015·Granted Nov 22, 2016·1 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →