Inventor · disambiguated record
James Vangordon
Also filed as: VANGORDON JAMES · VANGORDON JAMES ARTHUR
10 granted patents·25 citations·filing 2014–2021
84Inventor score
Technology areasH01J
Top patents by PatentIndex Score
10 records- 0194US9536726B2MALDI-TOF mass spectrometers with delay time variations and related methodsBIOMÉRIEUX INC·Filed 2015·Granted Jan 3, 2017·18 cites·27 claims
- 0286US10068760B2MALDI-TOF mass spectrometers with delay time variations and related methodsBIO MERIEUX INC·Filed 2016·Granted Sep 4, 2018·3 cites·31 claims
- 0384US10615023B2MALDI-TOF mass spectrometers with delay time variations and related methodsBIO MERIEUX INC·Filed 2018·Granted Apr 7, 2020·2 cites·20 claims
- 0471US10910209B2MALDI-TOF mass spectrometers with delay time variations and related methodsBIO MERIEUX INC·Filed 2020·Granted Feb 2, 2021·0 cites·20 claims
- 0569US11640904B2Methods for confirming charged-particle generation in an instrument, and related instrumentsBIO MERIEUX INC·Filed 2021·Granted May 2, 2023·0 cites·20 claims
- 0667US11309170B2Methods for testing or adjusting a charged-particle detector, and related detection systemsBIO MERIEUX INC·Filed 2020·Granted Apr 19, 2022·0 cites·19 claims
- 0762US10672598B2Methods for testing or adjusting a charged-particle detector, and related detection systemsBIO MERIEUX INC·Filed 2019·Granted Jun 2, 2020·0 cites·24 claims
- 0861US10903063B2Methods for confirming charged-particle generation in an instrument, and related instrumentsBIO MERIEUX INC·Filed 2019·Granted Jan 26, 2021·0 cites·23 claims
- 0957US9883576B2Low-power, compact piezoelectric particle emissionUNIV MISSOURI·Filed 2014·Granted Jan 30, 2018·2 cites·20 claims
- 1048US11605533B2Methods for aligning a light source of an instrument, and related instrumentsBIO MERIEUX INC·Filed 2019·Granted Mar 14, 2023·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →