Inventor · disambiguated record
Jacques Weinstock
Also filed as: SAUNDERS JAMES · WEINSTOCK JACQUES · WEINSTOCK JACQUES J
5 granted patents·27 citations·filing 1974–1981
76Inventor score
Top patents by PatentIndex Score
5 records- 0152US4042880AElectrode assembly for measuring the effective thickness of thru-hole plating circuit board workpiecesUNIT PROCESS ASSEMBLIES·Filed 1974·Granted Aug 16, 1977·9 cites·1 claims
- 0246US4190770ABackscatter instrument having indexing feature for measuring coating thickness of elements on a continuously moving web of substrate materialUNIT PROCESS ASSEMBLIES·Filed 1977·Granted Feb 26, 1980·9 cites·9 claims
- 0335US4115690ABackscatter instrument for measuring thickness of a continuously moving coated strip of substrate materialUNIT PROCESS ASSEMBLIES·Filed 1977·Granted Sep 19, 1978·5 cites·4 claims
- 0433US4229652ABackscatter apparatus and method for measuring thickness of a continuously moving coated strip of substrate materialUNIT PROCESS ASSEMBLIES·Filed 1978·Granted Oct 21, 1980·4 cites·7 claims
- 0525US4437000AAperture piece and method for calibrating backscatter thickness measuring instruments for measuring concave workpiecesUPA TECHNOLOGY INC·Filed 1981·Granted Mar 13, 1984·0 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →