Inventor · disambiguated record
Jae-Youn Wi
Also filed as: WI JAE-YOUN
1 granted patent·1 pending application·2 citations·filing 2015–2023
18Inventor score
Files withSAMSUNG ELECTRONICS CO LTD2
Top patents by PatentIndex Score
2 records- 0177US9261532B1Conductive atomic force microscope and method of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Feb 16, 2016·2 cites·20 claims
- 0246US2024234153A1Wafer polishing system, simulation and control method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →