Inventor · disambiguated record
Jeongho Ahn
Also filed as: AHN JEONGHO
10 granted patents·11 pending applications·30 citations·filing 2009–2024
83Inventor score
Top patents by PatentIndex Score
21 records- 0189US9952433B2Wearable device and method of outputting content thereofLG ELECTRONICS INC·Filed 2014·Granted Apr 24, 2018·17 cites·16 claims
- 0283US11754510B2Inspection system of semiconductor wafer and method of driving the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Sep 12, 2023·1 cites·16 claims
- 0383US10067067B2Substrate inspection apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Sep 4, 2018·4 cites·19 claims
- 0482US10136286B2Method for controlling external electronic device and electronic device for processing sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Nov 20, 2018·6 cites·17 claims
- 0572US12130242B2Inspection system of semiconductor wafer and method of driving the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Oct 29, 2024·0 cites·18 claims
- 0671US12487653B2Method for controlling electronic devices and electronic device thereofSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Dec 2, 2025·0 cites·18 claims
- 0769US10393672B2System and method of inspecting substrate and method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Aug 27, 2019·2 cites·20 claims
- 0862US2024192154A1Pattern inspection apparatus and pattern inspection method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0961US2025217960A1Defect region detection device and wafer defect detection system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1058US2025306070A1Apparatus and method for measuring electrical conductivity of semiconductor substrateSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1157US12436106B2Apparatus and method for inspecting semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Oct 7, 2025·0 cites·17 claims
- 1257US2025027875A1Optical imaging deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1356US2025061560A1Image processing for on-cell overlay measurementSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1455US2024151664A1Substrate inspection apparatus and a method of inspecting a substrate using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1555US2023332954A1Apparatus and method for inspecting and measuring semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1650US2024036119A1Battery life prediction device and operating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1750US2024284621A1Wearable electronic deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1849US2024036118A1Battery risk evaluation device and operating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1947US2025147560A1Electronic device comprising motor housingSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 2039US11678390B2Electronic device for performing wireless communication and wireless communication methodSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jun 13, 2023·0 cites·17 claims
- 2131US8237925B2Prism for inducing Brewster's angle transmission and fluorescence detection apparatus for improving signal-to noise ratio using thereofHONG YOUNGJOO·Filed 2009·Granted Aug 7, 2012·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →