Inventor · disambiguated record
Jeffrey D. Bruce
Also filed as: BRUCE JEFFREY · BRUCE JEFFREY D · BRUCE JEFFREY DUANE · STUBBS ERIC T
36 granted patents·3 pending applications·512 citations·filing 1996–2023
98Inventor score
Files withMICRON TECHNOLOGY INC32MICROSOFT TECHNOLOGY LICENSING LLC3ALTICE JR PETER P2BRUCE JEFFREY D1ROUND ROCK RES LLC1
Top patents by PatentIndex Score
39 records- 0193US7485836B2Row driver for selectively supplying operating power to imager pixelMICRON TECHNOLOGY INC·Filed 2006·Granted Feb 3, 2009·12 cites·11 claims
- 0291US5677567ALeads between chips assemblyMICRON TECHNOLOGY INC·Filed 1996·Granted Oct 14, 1997·93 cites·29 claims
- 0390US11165270B2Predictive management of battery operationMICROSOFT TECHNOLOGY LICENSING LLC·Filed 2019·Granted Nov 2, 2021·11 cites·20 claims
- 0486US7176434B2Row driven imager pixelMICRON TECHNOLOGY INC·Filed 2005·Granted Feb 13, 2007·6 cites·27 claims
- 0586US6208018B1Piggyback multiple dice assemblyMICRON TECHNOLOGY INC·Filed 1997·Granted Mar 27, 2001·80 cites·21 claims
- 0684US8138462B2Resetting a row driven imager pixelALTICE JR PETER P·Filed 2010·Granted Mar 20, 2012·4 cites·21 claims
- 0781US5894165ALeads between chips assemblyMICRON TECHNOLOGY INC·Filed 1997·Granted Apr 13, 1999·45 cites·8 claims
- 0880US6008533AControlling impedances of an integrated circuitMICRON TECHNOLOGY INC·Filed 1997·Granted Dec 28, 1999·53 cites·25 claims
- 0978US7737388B2Row driven imager pixelROUND ROCK RES LLC·Filed 2007·Granted Jun 15, 2010·3 cites·47 claims
- 1078US6028799AMemory circuit voltage regulatorMICRON TECHNOLOGY INC·Filed 1999·Granted Feb 22, 2000·17 cites·7 claims
- 1176US5877993AMemory circuit voltage regulatorMICRON TECHNOLOGY INC·Filed 1997·Granted Mar 2, 1999·16 cites·12 claims
- 1275US5770480AMethod of leads between chips assemblyMICRON TECHNOLOGY INC·Filed 1997·Granted Jun 23, 1998·35 cites·15 claims
- 1374US7196304B2Row driver for selectively supplying operating power to imager pixelMICRON TECHNOLOGY INC·Filed 2004·Granted Mar 27, 2007·7 cites·9 claims
- 1471US6232148B1Method and apparatus leads-between-chipsMICRON TECHNOLOGY INC·Filed 1999·Granted May 15, 2001·31 cites·7 claims
- 1569US6778452B2Circuit and method for voltage regulation in a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2003·Granted Aug 17, 2004·6 cites·10 claims
- 1668US5923672AMultipath antifuse circuitMICRON TECHNOLOGY INC·Filed 1997·Granted Jul 13, 1999·27 cites·27 claims
- 1763US8147003B2Wheel ornamentation for use with a vehicle wheelBRUCE JEFFREY D·Filed 2010·Granted Apr 3, 2012·3 cites·21 claims
- 1862US7215361B2Method for automated testing of the modulation transfer function in image sensorsMICRON TECHNOLOGY INC·Filed 2003·Granted May 8, 2007·8 cites·60 claims
- 1961US6011731ACell plate regulatorMICRON TECHNOLOGY INC·Filed 1999·Granted Jan 4, 2000·7 cites·16 claims
- 2060US6682954B1Method for employing piggyback multiple die #3MICRON TECHNOLOGY INC·Filed 1997·Granted Jan 27, 2004·25 cites·9 claims
- 2159US7646016B2Method for automated testing of the modulation transfer function in image sensorsMICRON TECHNOLOGY INC·Filed 2006·Granted Jan 12, 2010·1 cites·12 claims
- 2258US6052322AMemory circuit voltage regulatorMICRON TECHNOLOGY INC·Filed 1999·Granted Apr 18, 2000·6 cites·5 claims
- 2358US2025172380A1Parallel plate measurement apparatus for battery thickness measurementMICROSOFT TECHNOLOGY LICENSING LLC·Filed 2023·Application pending·0 cites
- 2453US8115157B2Row driven imager pixelALTICE JR PETER P·Filed 2010·Granted Feb 14, 2012·0 cites·13 claims
- 2552US6181617B1Method and apparatus for testing a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Jan 30, 2001·2 cites·4 claims
- 2651US2024396106A1Battery system with embedded charging coilMICROSOFT TECHNOLOGY LICENSING LLC·Filed 2023·Application pending·0 cites
- 2746US6188622B1Method of identifying a defect within a memory circuitMICRON TECHNOLOGY INC·Filed 2000·Granted Feb 13, 2001·1 cites·4 claims
- 2846US5982687AMethod of detecting leakage within a memory cell capacitorMICRON TECHNOLOGY INC·Filed 1999·Granted Nov 9, 1999·3 cites·5 claims
- 2944US5976911AControlling impedances of an integrated circuitMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 2, 1999·9 cites·15 claims
- 3043US2008117661A1Method, apparatus and system providing memory cells associated with a pixel arrayMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 3140US6882587B2Method of preparing to test a capacitorMICRON TECHNOLOGY INC·Filed 2004·Granted Apr 19, 2005·0 cites·5 claims
- 3239US6600687B2Method of compensating for a defect within a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2002·Granted Jul 29, 2003·0 cites·1 claims
- 3338US6469944B2Method of compensating for a defect within a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 22, 2002·0 cites·4 claims
- 3438US6445629B2Method of stressing a memory deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 3, 2002·0 cites·1 claims
- 3538US6418071B2Method of testing a memory cellMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 9, 2002·0 cites·2 claims
- 3638US6353564B1Method of testing a memory arrayMICRON TECHNOLOGY INC·Filed 2000·Granted Mar 5, 2002·0 cites·5 claims
- 3738US6226210B1Method of detecting a short from a digit line pair to groundMICRON TECHNOLOGY INC·Filed 2000·Granted May 1, 2001·0 cites·5 claims
- 3838US6198676B1Test deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Mar 6, 2001·0 cites·3 claims
- 3937US6026040AMethod of altering the margin affecting a memory cellMICRON TECHNOLOGY INC·Filed 1999·Granted Feb 15, 2000·1 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →