Inventor · disambiguated record
Jean Canteloup
Also filed as: BRAGUIER MICHEL A · CANTELOUP JEAN
9 granted patents·905 citations·filing 1978–1998
91Inventor score
Top patents by PatentIndex Score
9 records- 0196US5658418AApparatus for monitoring the dry etching of a dielectric film to a given thickness in an integrated circuitIBM·Filed 1995·Granted Aug 19, 1997·160 cites·8 claims
- 0295US6363294B1Method and system for semiconductor wafer fabrication process real-time in-situ interactive supervisionIBM·Filed 1998·Granted Mar 26, 2002·491 cites·7 claims
- 0384US5807761AMethod for real-time in-situ monitoring of a trench formation processIBM·Filed 1996·Granted Sep 15, 1998·80 cites·12 claims
- 0479US5648849AMethod of and device for in situ real time quantification of the morphology and thickness of a localized area of a surface layer of a thin layer structure during treatment of the latterSOFIE·Filed 1995·Granted Jul 15, 1997·81 cites·9 claims
- 0563US5898500ADevice and method for three-dimensional measurements and observation in situ of a surface layer deposited on a thin-film stackINSTRUMENTS SA·Filed 1997·Granted Apr 27, 1999·38 cites·12 claims
- 0653US4676644ADevice for monitoring the thickness of thin layersCIT ALCATEL·Filed 1984·Granted Jun 30, 1987·12 cites·6 claims
- 0748US5748296AMethod and device for in situ quantification, by reflectometry, of the morphology of a localized region during etching of the surface layer of a thin-film structureSOFIE INSTR·Filed 1996·Granted May 5, 1998·19 cites·12 claims
- 0848US5355217AAssembly for simultaneous observation and laser interferometric measurements, in particular on thin-film structuresSOFIE·Filed 1992·Granted Oct 11, 1994·16 cites·9 claims
- 0934US4207834AProcess and devices for the elaboration of preforms for optical fibersARMINES·Filed 1978·Granted Jun 17, 1980·8 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →