Inventor · disambiguated record
Jeremiah D. Hogan
Also filed as: HOGAN JEREMIAH · HOGAN JEREMIAH D
5 granted patents·1 pending application·58 citations·filing 1994–2009
80Inventor score
Top patents by PatentIndex Score
6 records- 0162US5455418AMicro-fourier transform ion cyclotron resonance mass spectrometerFiled 1994·Granted Oct 3, 1995·18 cites·24 claims
- 0261US6032513AApparatus and method for measuring contaminants in semiconductor processing chemicalsTEXAS INSTRUMENTS INC·Filed 1998·Granted Mar 7, 2000·21 cites·23 claims
- 0351US2011108568A1System and method of comparing two materials within a material distribution systemHOGAN JEREMIAH·Filed 2009·Application pending·0 cites
- 0436US5578829AOn-line monitor for moisture contamination in HCL gas and copper contamination in NH4 OH solutionsTEXAS INSTRUMENTS INC·Filed 1994·Granted Nov 26, 1996·11 cites·12 claims
- 0533US6200478B1Apparatus and method for inline removal of impurities from wet chemicalsTEXAS INSTRUMENTS INC·Filed 1999·Granted Mar 13, 2001·5 cites·10 claims
- 0628US6017453AApparatus and method for inline removal of impurities from wet chemicalsTEXAS INSTRUMENTS INC·Filed 1998·Granted Jan 25, 2000·3 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →