Inventor · disambiguated record
Jeffrey W. Honeycutt
Also filed as: HONEYCUTT JEFFREY · HONEYCUTT JEFFREY W
40 granted patents·434 citations·filing 1995–2006
98Inventor score
Files withMICRON TECHNOLOGY INC40
Top patents by PatentIndex Score
40 records- 0193US5644166ASacrificial CVD germanium layer for formation of high aspect ratio submicron VLSI contactsMICRON TECHNOLOGY INC·Filed 1995·Granted Jul 1, 1997·96 cites·23 claims
- 0284US6495406B1Method of forming lightly doped drain MOS transistor including forming spacers on gate electrode pattern before exposing gate insulatorMICRON TECHNOLOGY INC·Filed 2000·Granted Dec 17, 2002·29 cites·19 claims
- 0380US6617689B1Metal line and method of suppressing void formation thereinMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 9, 2003·22 cites·20 claims
- 0478US6524907B2Method of reducing electrical shorts from the bit line to the cell plateMICRON TECHNOLOGY INC·Filed 2002·Granted Feb 25, 2003·18 cites·21 claims
- 0578US6040208AAngled ion implantation for selective dopingMICRON TECHNOLOGY INC·Filed 1997·Granted Mar 21, 2000·55 cites·33 claims
- 0677US6455212B1Method for providing an alignment diffraction grating for photolithographic alignment during semiconductor fabricationMICRON TECHNOLOGY INC·Filed 2002·Granted Sep 24, 2002·10 cites·18 claims
- 0773US6544871B1Method of suppressing void formation in a metal lineMICRON TECHNOLOGY INC·Filed 2000·Granted Apr 8, 2003·15 cites·18 claims
- 0872US6723618B2Methods of forming field isolation structuresMICRON TECHNOLOGY INC·Filed 2002·Granted Apr 20, 2004·19 cites·19 claims
- 0967US6635396B2Method for providing an alignment diffraction grating for photolithographic alignment during semiconductor fabricationMICRON TECHNOLOGY INC·Filed 2002·Granted Oct 21, 2003·5 cites·16 claims
- 1067US6501140B2Transistor structuresMICRON TECHNOLOGY INC·Filed 2001·Granted Dec 31, 2002·12 cites·4 claims
- 1162US6808982B2Method of reducing electrical shorts from the bit line to the cell plateMICRON TECHNOLOGY INC·Filed 2003·Granted Oct 26, 2004·7 cites·36 claims
- 1259US6838373B2Lightly doped drain MOS transistorMICRON TECHNOLOGY INC·Filed 2002·Granted Jan 4, 2005·6 cites·30 claims
- 1359US6482572B1Method for providing an alignment diffraction grating for photolithographic alignment during semiconductor fabricationMICRON TECHNOLOGY INC·Filed 2000·Granted Nov 19, 2002·3 cites·17 claims
- 1457US6468859B1Method of reducing electrical shorts from the bit line to the cell plateMICRON TECHNOLOGY INC·Filed 1999·Granted Oct 22, 2002·15 cites·20 claims
- 1557US6391746B1Gettering regions and methods of forming gettering regions within a semiconductor waferMICRON TECHNOLOGY INC·Filed 2000·Granted May 21, 2002·3 cites·16 claims
- 1656US7115524B2Methods of processing a semiconductor substrateMICRON TECHNOLOGY INC·Filed 2004·Granted Oct 3, 2006·4 cites·112 claims
- 1755US6777144B2Method for patterning a photoresist material for semiconductor component fabricationMICRON TECHNOLOGY INC·Filed 2002·Granted Aug 17, 2004·2 cites·17 claims
- 1855US6573013B2Method for providing an alignment diffraction grating for photolithographic alignment during semiconductor fabricationMICRON TECHNOLOGY INC·Filed 2002·Granted Jun 3, 2003·2 cites·18 claims
- 1954US6331482B1Method of VLSI contact, trench, and via filling using a germanium underlayer with metallizationMICRON TECHNOLOGY INC·Filed 1996·Granted Dec 18, 2001·15 cites·32 claims
- 2052US7432212B2Methods of processing a semiconductor substrateMICRON TECHNOLOGY INC·Filed 2006·Granted Oct 7, 2008·0 cites·15 claims
- 2151US5989946AMethod of forming SRAM cells and pairs of field effect transistorsMICRON TECHNOLOGY INC·Filed 1997·Granted Nov 23, 1999·13 cites·12 claims
- 2250US6734071B1Methods of forming insulative material against conductive structuresMICRON TECHNOLOGY INC·Filed 2000·Granted May 11, 2004·4 cites·8 claims
- 2348US6849537B2Method of suppressing void formation in a metal lineMICRON TECHNOLOGY INC·Filed 2003·Granted Feb 1, 2005·2 cites·12 claims
- 2448US6239029B1Sacrificial germanium layer for formation of a contactMICRON TECHNOLOGY INC·Filed 1998·Granted May 29, 2001·9 cites·17 claims
- 2547US5773356AGettering regions and methods of forming gettering regions within a semiconductor waferMICRON TECHNOLOGY INC·Filed 1996·Granted Jun 30, 1998·8 cites·11 claims
- 2646US6597042B1Contact with germanium layerMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 22, 2003·2 cites·28 claims
- 2746US5929507AGettering regions and methods of forming gettering regions within a semiconductor waferMICRON TECHNOLOGY INC·Filed 1997·Granted Jul 27, 1999·7 cites·12 claims
- 2846US5753956ASemiconductor processing methods of forming complementary metal oxide semiconductor memory and other circuitry, and memory and other circuitryMICRON TECHNOLOGY INC·Filed 1996·Granted May 19, 1998·7 cites·6 claims
- 2945US6229213B1Germanium alloy electrical interconnect structureMICRON TECHNOLOGY INC·Filed 2000·Granted May 8, 2001·1 cites·36 claims
- 3045US5950079ASemiconductor processing methods of forming complementary metal oxide semiconductor memory and other circuitryMICRON TECHNOLOGY INC·Filed 1997·Granted Sep 7, 1999·7 cites·31 claims
- 3145US5691217ASemiconductor processing method of forming a pair of field effect transistors having different thickness gate dielectric layersMICRON TECHNOLOGY INC·Filed 1996·Granted Nov 25, 1997·10 cites·17 claims
- 3244US6114223AGettering regions and methods of forming gettering regions within a semiconductor waferMICRON TECHNOLOGY INC·Filed 1998·Granted Sep 5, 2000·6 cites·11 claims
- 3344US6064098ASemiconductor processing methods of forming complementary metal oxide semiconductor memory and other circuitry, and memory and other circuitryMICRON TECHNOLOGY INC·Filed 1998·Granted May 16, 2000·6 cites·13 claims
- 3442US7226872B2Lightly doped drain MOS transistorMICRON TECHNOLOGY INC·Filed 2004·Granted Jun 5, 2007·0 cites·13 claims
- 3542US6309967B1Method of forming a contactMICRON TECHNOLOGY INC·Filed 1997·Granted Oct 30, 2001·6 cites·43 claims
- 3642US6093968AGermanium alloy contact to a silicon substrateMICRON TECHNOLOGY INC·Filed 1998·Granted Jul 25, 2000·7 cites·27 claims
- 3740US6894332B2Apparatus for reducing electrical shorts from the bit line to the cell plateMICRON TECHNOLOGY INC·Filed 2001·Granted May 17, 2005·0 cites·20 claims
- 3839US6709937B2Transistor structuresMICRON TECHNOLOGY INC·Filed 2003·Granted Mar 23, 2004·0 cites·12 claims
- 3932US6048778AGettering regions and methods of forming gettering regions within a semiconductor waferMICRON TECHNOLOGY INC·Filed 1998·Granted Apr 11, 2000·1 cites·16 claims
- 4030US6111325AGettering regions and methods of forming gettering regions within a semiconductor waferMICRON TECHNOLOGY INC·Filed 1999·Granted Aug 29, 2000·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →