Inventor · disambiguated record

Jeon Hwangbo

Also filed as: HWANGBO JEON

1 granted patent·1 pending application·16 citations·filing 1996–2007

37Inventor score

Technology areasG11C

Files withQIMONDA NORTH AMERICA CORP1 SAMSUNG ELECTRONICS CO LTD1

Top patents by PatentIndex Score

2 records

0151US5983375AMulti-bit test circuit and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Nov 9, 1999·16 cites·25 claims
0229US2008222460A1Memory test circuitQIMONDA NORTH AMERICA CORP·Filed 2007·Application pending·0 cites

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →