Inventor · disambiguated record
Jeeeun Jung
Also filed as: JUNG Jeeeun
2 granted patents·6 pending applications·1 citations·filing 2016–2024
30Inventor score
Files withSAMSUNG ELECTRONICS CO LTD8
Top patents by PatentIndex Score
8 records- 0164US9989842B2Method of generating test patterns using random functionSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jun 5, 2018·1 cites·20 claims
- 0260US2024419084A1Optical proximity correction method and method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0359US2025004361A1Optical proximity correction method and semiconductor fabrication method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0459US2025172880A1Optical proximity correction (opc) method, and method of manufacturing mask by using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0554US2025173477A1Layout analysis method and mask manufacturing method including the layout analysis methodSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0650US2023205092A1Optical proximity correction method, mask manufacturing method, semiconductor chip manufacturing method using the same and computing deviceSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 0750US2024176227A1Optical proximity correction method and photomask fabrication method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0842US12044961B2Method of forming mask including curvilinear shape and method of forming semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jul 23, 2024·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →