Inventor · disambiguated record
Jeffrey C. Kalb, Jr.
Also filed as: KALB JEFFREY C · KALB JEFFREY CLIFFORD · KALB JR JEFFREY C
19 granted patents·538 citations·filing 1994–2000
96Inventor score
Top patents by PatentIndex Score
19 records- 0187US5598408AScalable processor to processor and processor to I/O interconnection network and method for parallel processing arraysMASPAR COMPUTER CORP·Filed 1994·Granted Jan 28, 1997·124 cites·29 claims
- 0282US5742177AMethod for testing a semiconductor device by measuring quiescent currents (IDDQ) at two different temperaturesINTEL CORP·Filed 1996·Granted Apr 21, 1998·55 cites·3 claims
- 0382US5627789ASense amplifier circuitry for differential semiconductor memoriesINTEL CORP·Filed 1995·Granted May 6, 1997·51 cites·7 claims
- 0478US6121669AIntegrated RC filtersMICRO DEVICES CORP CALIFORNIA·Filed 1997·Granted Sep 19, 2000·40 cites·24 claims
- 0577US6100713ATermination circuits and methods for memory buses and devicesMICRO DEVICES CORP CALIFORNIA·Filed 1999·Granted Aug 8, 2000·85 cites·16 claims
- 0663US6008665ATermination circuits and methods thereforMICRO DEVICES CORP CALIFORNIA·Filed 1998·Granted Dec 28, 1999·42 cites·16 claims
- 0760US5986461AUV methods for screening open circuit defects in CMOS integrated circuitsINTEL CORP·Filed 1996·Granted Nov 16, 1999·16 cites·4 claims
- 0860US5889409ALeakage tracking device sample for IDDQ measurement and defect resolutionINTEL CORP·Filed 1996·Granted Mar 30, 1999·22 cites·7 claims
- 0958US6307395B1Termination circuits and methods for bused and networked devicesMICRO DEVICES CORP CALIFORNIA·Filed 2000·Granted Oct 23, 2001·4 cites·12 claims
- 1055US5801533AMethod and apparatus with cascode biasing magneto field effect transistors for improved sensitivity and amplificationINTEL CORP·Filed 1996·Granted Sep 1, 1998·18 cites·20 claims
- 1155US5706163AESD-protected thin film capacitor structuresMICRO DEVICES CORP CALIFORNIA·Filed 1995·Granted Jan 6, 1998·15 cites·26 claims
- 1254US5760662AMethods and apparatus for improving frequency response of integrated RC filters with additional ground pinsMICRO DEVICES CORP CALIFORNIA·Filed 1996·Granted Jun 2, 1998·14 cites·20 claims
- 1347US5757055ATriple drain magneto field effect transistor with high conductivity central drainINTEL CORP·Filed 1996·Granted May 26, 1998·10 cites·8 claims
- 1444US6242934B1Background leakage zeroing by temperature and voltage dependence for IDDQ measurement and defect resolutionINTEL CORP·Filed 1997·Granted Jun 5, 2001·9 cites·24 claims
- 1541US5869977ADefect insertion testability mode for IDDQ testing methodsINTEL CORP·Filed 1996·Granted Feb 9, 1999·13 cites·19 claims
- 1638US5760581AMethod and apparatus coupling together magneto field effect transistors in series to accumulate the effects of magnetic field for improved sensitivity and linearityINTEL CORP·Filed 1996·Granted Jun 2, 1998·7 cites·19 claims
- 1737US6262434B1Integrated circuit structures and methods to facilitate accurate measurement of the IC devicesMICRO DEVICES CORP CALIFORNIA·Filed 1997·Granted Jul 17, 2001·7 cites·14 claims
- 1831US6107817AUV methods for screening open circuit defects in CMOS integrated circuitsINTEL CORP·Filed 1998·Granted Aug 22, 2000·1 cites·2 claims
- 1926US5652460AIntegrated resistor networks having reduced cross talkMICRO DEVICES CORP CALIFORNIA·Filed 1995·Granted Jul 29, 1997·5 cites·28 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →