Inventor · disambiguated record
Jerry D. Kline
Also filed as: KLINE JERRY D
13 granted patents·298 citations·filing 1999–2004
94Inventor score
Files withEAGLESTONE PARTNERS I LLC13
Top patents by PatentIndex Score
13 records- 0186US6815712B1Method for selecting components for a matched set from a wafer-interposer assemblyEAGLESTONE PARTNERS I LLC·Filed 2000·Granted Nov 9, 2004·34 cites·38 claims
- 0282US6537831B1Method for selecting components for a matched set using a multi wafer interposerEAGLESTONE PARTNERS I LLC·Filed 2000·Granted Mar 25, 2003·31 cites·37 claims
- 0379US6967494B2Wafer-interposer assemblyEAGLESTONE PARTNERS I LLC·Filed 2004·Granted Nov 22, 2005·24 cites·24 claims
- 0479US6483043B1Chip assembly with integrated power distribution between a wafer interposer and an integrated circuit chipEAGLESTONE PARTNERS I LLC·Filed 2000·Granted Nov 19, 2002·30 cites·32 claims
- 0579US6483330B1Method for selecting components for a matched set using wafer interposersEAGLESTONE PARTNERS I LLC·Filed 2000·Granted Nov 19, 2002·24 cites·42 claims
- 0677US6759741B2Matched set of integrated circuit chips selected from a multi wafer-interposerEAGLESTONE PARTNERS I LLC·Filed 2003·Granted Jul 6, 2004·22 cites·30 claims
- 0774US6812048B1Method for manufacturing a wafer-interposer assemblyEAGLESTONE PARTNERS I LLC·Filed 2000·Granted Nov 2, 2004·19 cites·17 claims
- 0872US6686657B1Interposer for improved handling of semiconductor wafers and method of use of sameEAGLESTONE PARTNERS I LLC·Filed 2000·Granted Feb 3, 2004·16 cites·25 claims
- 0971US6927083B2Method for constructing a wafer-interposer assemblyEAGLESTONE PARTNERS I LLC·Filed 2004·Granted Aug 9, 2005·15 cites·26 claims
- 1065US6392428B1Wafer level interposerEAGLESTONE PARTNERS I LLC·Filed 1999·Granted May 21, 2002·34 cites·7 claims
- 1163US6822469B1Method for testing multiple semiconductor wafersEAGLESTONE PARTNERS I LLC·Filed 2000·Granted Nov 23, 2004·29 cites·12 claims
- 1258US6825678B2Wafer level interposerEAGLESTONE PARTNERS I LLC·Filed 2002·Granted Nov 30, 2004·7 cites·29 claims
- 1353US6927593B2System for testing semiconductor die on multiple semiconductor wafersEAGLESTONE PARTNERS I LLC·Filed 2004·Granted Aug 9, 2005·13 cites·29 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →