Inventor · disambiguated record
Jens Luepke
Also filed as: LUEPKE JENS
5 granted patents·1 pending application·41 citations·filing 2002–2002
76Inventor score
Files withINFINEON TECHNOLOGIES AG4
Top patents by PatentIndex Score
6 records- 0175US6744272B2Test circuitFiled 2002·Granted Jun 1, 2004·25 cites·11 claims
- 0253US6618305B2Test circuit for testing a circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Sep 9, 2003·8 cites·9 claims
- 0348US6865707B2Test data generatorINFINEON TECHNOLOGIES AG·Filed 2002·Granted Mar 8, 2005·6 cites·20 claims
- 0437US7277338B2Method and device for testing semiconductor memory devicesINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 2, 2007·2 cites·16 claims
- 0534US2003005389A1Test circuit for testing a synchronous circuitFiled 2002·Application pending·0 cites
- 0631US6957373B2Address generator for generating addresses for testing a circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 18, 2005·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →