Inventor · disambiguated record
Jens Lüpke
Also filed as: LUEPKE JENS
12 granted patents·111 citations·filing 1999–2002
90Inventor score
Top patents by PatentIndex Score
12 records- 0180US6556492B2System for testing fast synchronous semiconductor circuitsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 29, 2003·31 cites·10 claims
- 0270US6515319B2Field-effect-controlled transistor and method for fabricating the transistorINFINEON TECHNOLOGIES AG·Filed 2001·Granted Feb 4, 2003·17 cites·6 claims
- 0367US6535007B2Component holder for testing devices and component holder system microlithographyINFINEON TECHNOLOGIES AG·Filed 2001·Granted Mar 18, 2003·16 cites·11 claims
- 0464US6721904B2System for testing fast integrated digital circuits, in particular semiconductor memory modulesINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 13, 2004·15 cites·29 claims
- 0561US6871306B2Method and device for reading and for checking the time position of data response signals read out from a memory module to be testedINFINEON TECHNOLOGIES AG·Filed 2001·Granted Mar 22, 2005·12 cites·20 claims
- 0653US7117404B2Test circuit for testing a synchronous memory circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 3, 2006·8 cites·6 claims
- 0745US7062690B2System for testing fast synchronous digital circuits, particularly semiconductor memory chipsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jun 13, 2006·3 cites·16 claims
- 0841US6862702B2Address counter for addressing synchronous high-frequency digital circuits, in particular memory devicesINFINEON TECHNOLOGIES AG·Filed 2001·Granted Mar 1, 2005·3 cites·10 claims
- 0941US6839397B2Circuit configuration for generating control signals for testing high-frequency synchronous digital circuitsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jan 4, 2005·3 cites·11 claims
- 1036US6396752B2Method of testing a memory cell having a floating gateINFINEON TECHNOLOGIES AG·Filed 2001·Granted May 28, 2002·1 cites·7 claims
- 1134US7117403B2Method and device for generating digital signal patternsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Oct 3, 2006·0 cites·18 claims
- 1226US6268718B1Burn-in test deviceSIEMENS AG·Filed 1999·Granted Jul 31, 2001·2 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →