Inventor · disambiguated record
Jeffrey Mackey
Also filed as: MACKEY JEFFREY · MACKEY JEFFREY L · MACKEY JEFFREY R
14 granted patents·7 pending applications·173 citations·filing 2003–2022
92Inventor score
Files withMICRON TECHNOLOGY INC9SEMICONDUCTOR COMPONENTS IND4MACKEY JEFFREY2MACKEY JEFFREY L2APTINA IMAGING CORP1
Top patents by PatentIndex Score
21 records- 0196US9202833B2Imaging systems with baffle gridsSEMICONDUCTOR COMPONENTS IND·Filed 2014·Granted Dec 1, 2015·23 cites·19 claims
- 0295US7538858B2Photolithographic systems and methods for producing sub-diffraction-limited featuresMICRON TECHNOLOGY INC·Filed 2006·Granted May 26, 2009·44 cites·36 claims
- 0393US7053987B2Methods and systems for controlling radiation beam characteristics for microlithographic processingMICRON TECHNOLOGY INC·Filed 2005·Granted May 30, 2006·14 cites·27 claims
- 0491US7283205B2Optimized optical lithography illumination source for use during the manufacture of a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2005·Granted Oct 16, 2007·12 cites·9 claims
- 0591US7046339B2Optimized optical lithography illumination source for use during the manufacture of a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2004·Granted May 16, 2006·38 cites·12 claims
- 0688US7130022B2Methods and systems for controlling radiation beam characteristics for microlithographic processingMICRON TECHNOLOGY INC·Filed 2006·Granted Oct 31, 2006·8 cites·21 claims
- 0786US6894765B2Methods and systems for controlling radiation beam characteristics for microlithographic processingMICRON TECHNOLOGY INC·Filed 2003·Granted May 17, 2005·21 cites·45 claims
- 0881US9172892B2Imaging systems with image pixels having varying light collecting areasSEMICONDUCTOR COMPONENTS IND·Filed 2013·Granted Oct 27, 2015·5 cites·16 claims
- 0977US9179110B2Imaging systems with modified clear image pixelsSEMICONDUCTOR COMPONENTS IND·Filed 2013·Granted Nov 3, 2015·4 cites·17 claims
- 1077US9093579B2Dielectric barriers for pixel arraysMACKEY JEFFREY·Filed 2011·Granted Jul 28, 2015·3 cites·6 claims
- 1168US9338413B2Imaging systems with image pixels having adjustable spectral responsesSEMICONDUCTOR COMPONENTS IND·Filed 2013·Granted May 10, 2016·1 cites·23 claims
- 1257US2014313379A1Imaging systems with crosstalk reduction structuresAPTINA IMAGING CORP·Filed 2013·Application pending·0 cites
- 1355US7760329B2Optimized optical lithography illumination source for use during the manufacture of a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2007·Granted Jul 20, 2010·0 cites·5 claims
- 1455US2009203216A1Photolithographic systems and methods for producing sub-diffraction-limited featuresMICRON TECHNOLOGY INC·Filed 2009·Application pending·0 cites
- 1547US2009091644A1Metallic nanostructure color filter array and method of making the sameMACKEY JEFFREY L·Filed 2007·Application pending·0 cites
- 1644US2006216844A1Optimized optical lithography illumination source for use during the manufacture of a semiconductor deviceSTANTON WILLIAM A·Filed 2006·Application pending·0 cites
- 1743US7823440B2Systems and methods for characterizing thickness and topography of microelectronic workpiece layersMICRON TECHNOLOGY INC·Filed 2007·Granted Nov 2, 2010·0 cites·26 claims
- 1841US12189117B2Self-cleaning camera lens system and methodMACKEY JEFFREY·Filed 2022·Granted Jan 7, 2025·0 cites·19 claims
- 1939US2012200749A1Imagers with structures for near field imagingBOETTIGER ULRICH·Filed 2011·Application pending·0 cites
- 2039US2007048628A1Plasmonic array for maskless lithographyMACKEY JEFFREY L·Filed 2005·Application pending·0 cites
- 2136US2004129867A1Force measurement system using polarization-state modulated optical polarimetryFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →