Inventor · disambiguated record
Je Hoon Oh
Also filed as: OH JE H · OH JE HOON
7 granted patents·2 pending applications·311 citations·filing 1992–2024
86Inventor score
Files withIUCF HYU ERICA CAMPUS3PITNEY BOWES INC3ED TECH CO LTD1KOREA ADVANCED INST SCI & TECH1SAMSUNG ELECTRONICS CO LTD1
Top patents by PatentIndex Score
9 records- 0191US5388049AValue mail monitoring system and methodPITNEY BOWES INC·Filed 1993·Granted Feb 7, 1995·130 cites·15 claims
- 0287US6336986B1Method for producing hybrid driveshaftKOREA ADVANCED INST SCI & TECH·Filed 1998·Granted Jan 8, 2002·48 cites·15 claims
- 0384US5446667AJust-in-time mail delivery system and methodPITNEY BOWES INC·Filed 1992·Granted Aug 29, 1995·52 cites·3 claims
- 0479US5873073AMethod and system for mail piece production utilizing a data center and inter-related communication networksPITNEY BOWES INC·Filed 1996·Granted Feb 16, 1999·79 cites·19 claims
- 0563US2025022608A1Intelligence based on morphological and hemodynamic factors of aneurysmIUCF HYU ERICA CAMPUS·Filed 2024·Application pending·0 cites
- 0658US2023260661A1System and method for augmenting aneurysm learning dataIUCF HYU ERICA CAMPUS·Filed 2021·Application pending·0 cites
- 0757US11550230B2Substrate deforming device for proximity exposure, and substrate deforming method for proximity exposure using sameIUCF HYU ERICA CAMPUS·Filed 2021·Granted Jan 10, 2023·0 cites·13 claims
- 0848US7428283B2Data recovery algorithm using data position detection and serial data receiver adopting the sameED TECH CO LTD·Filed 2004·Granted Sep 23, 2008·2 cites·3 claims
- 0938US10262841B2Plasma monitoring deviceSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Apr 16, 2019·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →