Inventor · disambiguated record
Je-Kwon Park
Also filed as: PARK JE-KWON
0 granted patents·2 pending applications·0 citations·filing 2007–2008
Technology areasH10P
Top patents by PatentIndex Score
2 records- 0139US2008205746A1Method of inspecting an identification mark, method of inspecting a wafer using the same, and apparatus for performing the methodSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 0235US2008037857A1Method of classifying directional defects on an object and apparatus for performing the sameLIM YOUNG-KYU·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →