Inventor · disambiguated record
Jean-Pierre Raskin
Also filed as: RASKIN JEAN-PIERRE
8 granted patents·3 pending applications·33 citations·filing 2006–2023
81Inventor score
Files withSOITEC SILICON ON INSULATOR6UNIV CATHOLIQUE LOUVAIN3COMMISSARIAT ENERGIE ATOMIQUE1PARDOEN THOMAS1
Top patents by PatentIndex Score
11 records- 0196US11367650B2Structures for radiofrequency applications and related methodsSOITEC SILICON ON INSULATOR·Filed 2020·Granted Jun 21, 2022·3 cites·20 claims
- 0284US7585748B2Process for manufacturing a multilayer structure made from semiconducting materialsSOITEC SILICON ON INSULATOR·Filed 2006·Granted Sep 8, 2009·24 cites·20 claims
- 0381US10943815B2Structure for radiofrequency applicationsSOITEC SILICON ON INSULATOR·Filed 2017·Granted Mar 9, 2021·2 cites·19 claims
- 0480US11538689B2Method of electrochemically processing a substrate and integrated circuit deviceUNIV CATHOLIQUE LOUVAIN·Filed 2019·Granted Dec 27, 2022·4 cites·15 claims
- 0574US11923239B2Structures for radiofrequency applications and related methodsSOITEC SILICON ON INSULATOR·Filed 2022·Granted Mar 5, 2024·0 cites·20 claims
- 0646US10429436B2Method, device and system for measuring an electrical characteristic of a substrateSOITEC SILICON ON INSULATOR·Filed 2016·Granted Oct 1, 2019·0 cites·19 claims
- 0745US10819282B2Method for minimizing distortion of a signal in a radiofrequency circuitSOITEC SILICON ON INSULATOR·Filed 2018·Granted Oct 27, 2020·0 cites·20 claims
- 0842US2023411309A1Rf substrate comprising depletion regions induced by field effectCOMMISSARIAT ENERGIE ATOMIQUE·Filed 2023·Application pending·0 cites
- 0937US11222944B2Integrated circuit device and method of manufacturing thereofUNIV CATHOLIQUE LOUVAIN·Filed 2019·Granted Jan 11, 2022·0 cites·10 claims
- 1037US2010057381A1Imposing and determining stress in sub-micron samplesPARDOEN THOMAS·Filed 2008·Application pending·0 cites
- 1135US2010224006A1Internal Stress Actuated Micro- and Nanomachines for Testing Physical Properties Of Micro and Nano-Sized Material Samples.UNIV CATHOLIQUE LOUVAIN·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →