Inventor · disambiguated record
Jean-Luc Rouviere
Also filed as: ROUVIERE JEAN-LUC
1 granted patent·2 pending applications·0 citations·filing 2004–2017
8Inventor score
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3 records- 0135US10593511B2Method of determining the deflection of an electron beam resulting from an electric field and/or a magnetic fieldCOMMISSARIAT ENERGIE ATOMIQUE·Filed 2017·Granted Mar 17, 2020·0 cites·20 claims
- 0225US2006288797A1Method for measuring physical parameters of at least one micrometric or nanometric dimensional phase in a composite systemROUVIERE JEAN-LUC·Filed 2004·Application pending·0 cites
- 0317US2013206968A1Method to facilitate positioning of diffraction spotsROUVIERE JEAN-LUC·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →