Inventor · disambiguated record
Jean-Philippe Schweitzer
Also filed as: SCHWEITZER JEAN · SCHWEITZER JEAN-PHILIPPE
5 granted patents·7 pending applications·18 citations·filing 2000–2018
72Inventor score
Files withSAINT GOBAIN6SCHWEITZER JEAN-PHILIPPE2COMM A L EN ATOM ET AUX EN ALTERNA1LIN XIAOFENG1SIEMENS AG1
Top patents by PatentIndex Score
12 records- 0181US9742155B2Modular laser apparatusSAINT GOBAIN·Filed 2014·Granted Aug 22, 2017·6 cites·15 claims
- 0281US9110035B2Method and system for detecting defects of transparent substrateZHENG YUAN·Filed 2010·Granted Aug 18, 2015·6 cites·38 claims
- 0350US9753290B2Modular laser apparatusSAINT GOBAIN·Filed 2014·Granted Sep 5, 2017·0 cites·13 claims
- 0450US7010748B1Method and system for displaying site-specific bookmarks on a computerSIEMENS AG·Filed 2000·Granted Mar 7, 2006·6 cites·17 claims
- 0543US2019284868A1Multiple glazingSAINT GOBAIN·Filed 2017·Application pending·0 cites
- 0641US9391300B2Method of producing a transparent diffusive OLED substrateSAINT GOBAIN·Filed 2013·Granted Jul 12, 2016·0 cites·27 claims
- 0740US2020339467A1Method of bending glass sheetsSAINT GOBAIN·Filed 2018·Application pending·0 cites
- 0840US2011310244A1System and method for detecting a defect of a substrateSCHWEITZER JEAN-PHILIPPE·Filed 2010·Application pending·0 cites
- 0940US2011083711A1Energy generating device comprising a photovoltaic converter and a thermoelectric converter, the latter converter being included within the supporting substrate of the photovoltaic converterCOMM A L EN ATOM ET AUX EN ALTERNA·Filed 2008·Application pending·0 cites
- 1036US2016016846A1Method for heat-treating a coatingSAINT GOBAIN·Filed 2014·Application pending·0 cites
- 1134US2012133762A1Method and system for detecting and classifying a defect of a substrateSCHWEITZER JEAN-PHILIPPE·Filed 2010·Application pending·0 cites
- 1230US2012105624A1Method and device for defect inspection in separated transparent and/or semi-transparent bodyLIN XIAOFENG·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →