Inventor · disambiguated record
Jennifer Tan
Also filed as: TAN JENNIFER · TAN JENNIFER DEE
9 granted patents·7 pending applications·1,270 citations·filing 1996–2012
91Inventor score
Top patents by PatentIndex Score
16 records- 0198US5959098ASubstrate preparation processAFFYMETRIX INC·Filed 1996·Granted Sep 28, 1999·583 cites·15 claims
- 0297US6156501AArrays of modified nucleic acid probes and methods of useAFFYMETRIX INC·Filed 1996·Granted Dec 5, 2000·545 cites·72 claims
- 0394US6706875B1Substrate preparation processAFFYMETRIX INC·Filed 2000·Granted Mar 16, 2004·91 cites·52 claims
- 0489US6307042B1Substrate preparation processAFFYMETRIX INC·Filed 1999·Granted Oct 23, 2001·43 cites·10 claims
- 0584US7794943B2Modified nucleic acid probesAFFYMETRIX INC·Filed 2008·Granted Sep 14, 2010·5 cites·23 claims
- 0673US8067578B2Substrate preparation processGOLDBERG MARTIN J·Filed 2009·Granted Nov 29, 2011·1 cites·13 claims
- 0762US8637434B2System for photolithographic synthesis of polymer arraysAFFYMETRIX INC·Filed 2012·Granted Jan 28, 2014·0 cites·17 claims
- 0859US7375198B2Modified nucleic acid probesAFFYMETRIX INC·Filed 2003·Granted May 20, 2008·2 cites·17 claims
- 0957US2009062148A1Substrate preparation processAFFYMETRIX INC·Filed 2006·Application pending·0 cites
- 1056US8309496B2Methods for photolithographic synthesis of polymer arrays utilizing anti-reflective coatingsGOLDBERG MARTIN J·Filed 2011·Granted Nov 13, 2012·0 cites·10 claims
- 1155US2006008840A1Substrate preparation processAFFYMETRIX INC·Filed 2005·Application pending·0 cites
- 1254US2005181431A1Substrate preparation processAFFYMETRIX INC·Filed 2005·Application pending·0 cites
- 1352US2005181396A1Substrate preparation processAFFYMETRIX INC·Filed 2004·Application pending·0 cites
- 1452US2011092382A1Modified Nucleic Acid ProbesAFFYMETRIX INC·Filed 2010·Application pending·0 cites
- 1552US2006160099A1Substrate preparation processAFFYMETRIX INC·Filed 2004·Application pending·0 cites
- 1650US2004105932A1Substrate preparation processAFFYMETRIX INC·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →