Inventor · disambiguated record

Jen-Chou Tseng

Also filed as: TSENG JEN-CHOU

65 granted patents·3 pending applications·694 citations·filing 2004–2023

98Inventor score

Technology areasH10D H10P H10W H01L H02H

Files withTAIWAN SEMICONDUCTOR MFG CO LTD45 TAIWAN SEMICONDUCTOR MFG11 WINBOND ELECTRONICS CORP5 LIN WUN-JIE2 LAI DA-WEI1

Top patents by PatentIndex Score

68 records

0198US9368487B1Semiconductor device with dynamic low voltage triggering mechanismTAIWAN SEMICONDUCTOR MFG·Filed 2015·Granted Jun 14, 2016·47 cites·25 claims
0297US8735993B2FinFET body contact and method of making sameLO CHING-HSIUNG·Filed 2012·Granted May 27, 2014·412 cites·19 claims
0396US9172242B2Electrostatic discharge protection for three dimensional integrated circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2012·Granted Oct 27, 2015·24 cites·20 claims
0494US9608616B1Power clamp circuits and methodsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Mar 28, 2017·10 cites·20 claims
0594US8928093B2FinFET body contact and method of making sameTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Jan 6, 2015·14 cites·20 claims
0694US8779517B2FinFET-based ESD devices and methods for forming the sameLIN WUN-JIE·Filed 2012·Granted Jul 15, 2014·24 cites·20 claims
0793US9117669B2Apparatus for ESD protectionTAIWAN SEMICONDUCTOR MFG·Filed 2012·Granted Aug 25, 2015·13 cites·15 claims
0892US10325906B2ESD testing structure, method of using same and method of forming sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jun 18, 2019·7 cites·20 claims
0992US9397098B2FinFET-based ESD devices and methods for forming the sameTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Jul 19, 2016·13 cites·20 claims
1092US9312384B2FinFET body contact and method of making sameTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Apr 12, 2016·10 cites·20 claims
1191US10629588B2ESD hard backend structures in nanometer dimensionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Apr 21, 2020·3 cites·20 claims
1291US9190519B2FinFET-based ESD devices and methods for forming the sameTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Nov 17, 2015·8 cites·20 claims
1390US9559008B2FinFET-based ESD devices and methods for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jan 31, 2017·5 cites·20 claims
1490US8730626B2Electrostatic discharge protectionTSENG JEN-CHOU·Filed 2011·Granted May 20, 2014·16 cites·20 claims
1588US9318621B2Rotated STI diode on FinFET technologyTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Apr 19, 2016·7 cites·20 claims
1688US8779518B2Apparatus for ESD protectionTAIWAN SEMICONDUCTOR MANFACTURING COMPANY LTD·Filed 2012·Granted Jul 15, 2014·9 cites·19 claims
1786US10283210B2Memory device with a fuse protection circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted May 7, 2019·4 cites·20 claims
1886US10170461B2ESD hard backend structures in nanometer dimensionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jan 1, 2019·2 cites·20 claims
1986US8823129B2Latch-up prevention structure and method for ultra-small high voltage tolerant cellLAI DA-WEI·Filed 2010·Granted Sep 2, 2014·9 cites·20 claims
2085US10158225B2ESD protection system utilizing gate-floating scheme and control circuit thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Dec 18, 2018·2 cites·20 claims
2184US10109366B2Memory device with a fuse protection circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Oct 23, 2018·4 cites·20 claims
2284US10096589B2Fin ESD protection diode and fabrication method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Oct 9, 2018·3 cites·20 claims
2383US12002706B2Structure and method for enhancing robustness of ESD deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jun 4, 2024·0 cites·20 claims
2483US11264374B2Method of forming electrostatic discharge (ESD) testing structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Mar 1, 2022·1 cites·20 claims
2583US10957687B2ESD hard backend structures in nanometer dimensionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Mar 23, 2021·1 cites·20 claims
2683US10803967B2Memory device with a fuse protection circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Oct 13, 2020·1 cites·20 claims
2783US10643726B2Memory device with a fuse protection circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted May 5, 2020·3 cites·20 claims
2883US9917079B2Electrostatic discharge protection circuit and method for radio frequency circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Mar 13, 2018·4 cites·20 claims
2983US9443840B2Methods and apparatus for ESD structuresTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Sep 13, 2016·5 cites·20 claims
3082US12471326B2Guard ring and circuit deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Nov 11, 2025·0 cites·4 claims
3182US10026727B2FinFET-based ESD devices and methods for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jul 17, 2018·2 cites·20 claims
3282US9537306B2ESD protection system utilizing gate-floating scheme and control circuit thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jan 3, 2017·2 cites·20 claims
3380US8664723B1Integrated circuit structures having base resistance tuning regions and methods for forming the sameTAIWAN SEMICONDUCTOR MFG·Filed 2012·Granted Mar 4, 2014·5 cites·20 claims
3479US9450044B2Guard ring structure and method of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Sep 20, 2016·2 cites·20 claims
3578US10026640B2Structure and method for enhancing robustness of ESD deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jul 17, 2018·2 cites·20 claims
3677US8809905B2Vertical BJT and SCR for ESDLIN WUN-JIE·Filed 2011·Granted Aug 19, 2014·5 cites·20 claims
3776US9979186B2Electrostatic discharge protection for three dimensional integrated circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted May 22, 2018·2 cites·20 claims
3875US11450735B2Method of forming guard ring and circuit deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Sep 20, 2022·0 cites·20 claims
3974US10756082B2Method of forming electrostatic discharge (ESD) testing structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Aug 25, 2020·1 cites·20 claims
4073US11742236B2Structure and method for enhancing robustness of ESD deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Aug 29, 2023·0 cites·20 claims
4173US10991442B2Memory device with a fuse protection circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Apr 27, 2021·0 cites·20 claims
4273US7329925B2Device for electrostatic discharge protectionWINBOND ELECTRONICS CORP·Filed 2006·Granted Feb 12, 2008·5 cites·5 claims
4369US10269986B2Rotated STI diode on FinFET technologyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Apr 23, 2019·1 cites·21 claims
4467US10284190B2Voltage detector circuits and methodsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted May 7, 2019·1 cites·20 claims
4566US10868112B2Circuit device including guard ring and method of forming guard ringTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 15, 2020·0 cites·20 claims
4663US9620957B2Electrostatic discharge (ESD) control circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Apr 11, 2017·1 cites·20 claims
4762US10546850B2FinFET-based ESD devices and methods for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jan 28, 2020·0 cites·20 claims
4862US8692289B2Fast turn on silicon controlled rectifiers for ESD protectionSU YU-TI·Filed 2012·Granted Apr 8, 2014·2 cites·20 claims
4961US10854501B2Structure and method for enhancing robustness of ESD deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 1, 2020·0 cites·20 claims
5061US9281681B2ESD protection circuits and methodsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2012·Granted Mar 8, 2016·1 cites·10 claims

Showing the top 50 of 68 patent records by PatentIndex Score.

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →