Inventor · disambiguated record
Jin Abe
Also filed as: ABE JIN
11 granted patents·2 pending applications·241 citations·filing 1994–2016
89Inventor score
Top patents by PatentIndex Score
13 records- 0183US6333932B1Connectionless communications system, its test method, and intra-station control systemFUJITSU LTD·Filed 1995·Granted Dec 25, 2001·143 cites·13 claims
- 0267US8687454B2Semiconductor storage apparatus and semiconductor integrated circuitABE JIN·Filed 2012·Granted Apr 1, 2014·4 cites·6 claims
- 0364US5974458AData transfer accounting device and method for performing an accounting process including an accounting information collecting processFUJITSU LTD·Filed 1996·Granted Oct 26, 1999·28 cites·18 claims
- 0462US9542285B2Memory device, storage method and control deviceFUJITSU LTD·Filed 2014·Granted Jan 10, 2017·1 cites·9 claims
- 0557US5561662ASubscriber information processing method in a connectionless data serviceFUJITSU LTD·Filed 1994·Granted Oct 1, 1996·31 cites·17 claims
- 0653US7551612B2Intra-station control system for connectionless communications systemFUJITSU LTD·Filed 1999·Granted Jun 23, 2009·30 cites·2 claims
- 0752US8027221B2Memory deviceFUJITSU LTD·Filed 2009·Granted Sep 27, 2011·2 cites·20 claims
- 0851US8856474B2Nonvolatile memory unit with secure erasing functionISE MASAHIRO·Filed 2011·Granted Oct 7, 2014·2 cites·16 claims
- 0946US7434086B2Functional device, function maintaining method and function maintaining programFUJITSU LTD·Filed 2004·Granted Oct 7, 2008·0 cites·20 claims
- 1041US2007230147A1Circuit board and electronic apparatus having the sameFUJITSU LTD·Filed 2006·Application pending·0 cites
- 1140US9099198B2Semiconductor memory apparatusFUJITSU LTD·Filed 2014·Granted Aug 4, 2015·0 cites·7 claims
- 1238US9921779B2Memory apparatus, memory system and memory controlling methodFUJITSU LTD·Filed 2016·Granted Mar 20, 2018·0 cites·14 claims
- 1335US2015355706A1Electronic device and method for controlling electronic deviceFUJITSU LTD·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →