Inventor · disambiguated record
Jinwoo Ahn
Also filed as: AHN JINWOO
4 granted patents·8 pending applications·9 citations·filing 2007–2024
64Inventor score
Top patents by PatentIndex Score
12 records- 0175US2025044222A1Image measurement device and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0262US2025271254A1Semiconductor measurement device and operating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0357US8525489B2System and method for directly and instantaneously controlling exciter of generatorAHN JINWOO·Filed 2008·Granted Sep 3, 2013·6 cites·6 claims
- 0455US2025377311A1Method for measuring semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0554US2025251872A1Electronic apparatus and controlling method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0653US2025060276A1System and method of optical measurement of numerical aperture of objective lensSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0753US2025189778A1Illumination optical module, imaging system, and image processing method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0852US12111270B2Method of inspecting a wafer and apparatus for performing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Oct 8, 2024·0 cites·17 claims
- 0949US11921270B2Inspection system including reference specimen and method of forming semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Mar 5, 2024·0 cites·20 claims
- 1049US2024125709A1Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1146US7902787B2Driving circuit for single-phase switched reluctance motor and driving method thereofUNIV KYUNGSUNG IND COOP FOUND·Filed 2007·Granted Mar 8, 2011·3 cites·23 claims
- 1244US2023204422A1Imaging assembly and spectral imaging ellipsometer including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →