Inventor · disambiguated record
Jin Youp Cha
Also filed as: CHA JIN Y · CHA JIN YOUP
21 granted patents·58 citations·filing 1994–2018
92Inventor score
Top patents by PatentIndex Score
21 records- 0194US9792969B1Semiconductor device and semiconductor systemSK HYNIX INC·Filed 2017·Granted Oct 17, 2017·16 cites·15 claims
- 0289US10089040B2Memory apparatus relating to on die terminationSK HYNIX INC·Filed 2016·Granted Oct 2, 2018·7 cites·8 claims
- 0383US10529437B2Semiconductor apparatus and system relating to performing a high speed test in a low speed operation environmentSK HYNIX INC·Filed 2018·Granted Jan 7, 2020·2 cites·27 claims
- 0481US8823433B2Data output circuitSK HYNIX INC·Filed 2013·Granted Sep 2, 2014·5 cites·14 claims
- 0575US10637638B2Semiconductor apparatus for transmitting and receiving a signal in synchronization with a clock signalSK HYNIX INC·Filed 2018·Granted Apr 28, 2020·2 cites·19 claims
- 0672US9275722B2Memory device preventing fail caused by successive read operations and system including the sameSK HYNIX INC·Filed 2013·Granted Mar 1, 2016·4 cites·18 claims
- 0766US9570151B1Semiconductor device and semiconductor systemSK HYNIX INC·Filed 2016·Granted Feb 14, 2017·2 cites·20 claims
- 0866US8358555B2Fuse circuit and control method thereofSK HYNIX INC·Filed 2010·Granted Jan 22, 2013·3 cites·13 claims
- 0964US9013950B2Column select signal generation circuitCHA JIN YOUP·Filed 2012·Granted Apr 21, 2015·3 cites·8 claims
- 1060US9960770B2Semiconductor integrated circuit device regarding the detection of degradationSK HYNIX INC·Filed 2016·Granted May 1, 2018·1 cites·19 claims
- 1153US8867287B2Test circuit and method of semiconductor memory apparatusCHA JIN YOUP·Filed 2012·Granted Oct 21, 2014·1 cites·13 claims
- 1252US10204005B2Error detection circuit and semiconductor apparatus using the sameSK HYNIX INC·Filed 2015·Granted Feb 12, 2019·1 cites·15 claims
- 1351US8049544B2Delay locked loop circuitHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Nov 1, 2011·2 cites·31 claims
- 1448US8184496B2Semiconductor device and method for operating the sameCHA JIN-YOUP·Filed 2009·Granted May 22, 2012·0 cites·13 claims
- 1548US5470915AABS resins having impact resistance and low-gloss properties and processes for preparing themMIWON PETROCHEMICAL CORP·Filed 1994·Granted Nov 28, 1995·9 cites·16 claims
- 1646US10102890B2Semiconductor device and semiconductor systemSK HYNIX INC·Filed 2017·Granted Oct 16, 2018·0 cites·20 claims
- 1743US8717087B2Anti-fuse circuitCHA JIN YOUP·Filed 2012·Granted May 6, 2014·0 cites·12 claims
- 1841US9412427B2Precharge circuit and semiconductor apparatus including the sameSK HYNIX INC·Filed 2014·Granted Aug 9, 2016·0 cites·18 claims
- 1941US9025406B2Semiconductor integrated circuit and method of driving the sameSK HYNIX INC·Filed 2013·Granted May 5, 2015·0 cites·18 claims
- 2039US8908452B2Semiconductor memory apparatusSK HYNIX INC·Filed 2013·Granted Dec 9, 2014·0 cites·20 claims
- 2138US8749298B2Anti-fuse circuitCHA JIN YOUP·Filed 2012·Granted Jun 10, 2014·0 cites·15 claims
Join the waitlist — get patent alerts
Get an alert when Jin Youp Cha files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →