Inventor · disambiguated record
Jinn-Yeh Chien
Also filed as: CHIEN JINN-YEH
19 granted patents·1 pending application·88 citations·filing 2004–2020
92Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD7TAIWAN SEMICONDUCTOR MFG5CHIEN JINN-YEH4KO CHEN-TING2YANG SHU-CHUN2
Top patents by PatentIndex Score
20 records- 0188US8453043B2Built-in bit error rate test circuitCHIEN JINN-YEH·Filed 2010·Granted May 28, 2013·13 cites·20 claims
- 0280US9405275B2Time-to-digital converter and related methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Aug 2, 2016·3 cites·20 claims
- 0380US7213186B2Memory built-in self test circuit with full error mapping capabilityTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted May 1, 2007·29 cites·29 claims
- 0479US8184760B2Adaptive elastic buffer for communicationsCHIEN JINN-YEH·Filed 2008·Granted May 22, 2012·12 cites·29 claims
- 0578US9063519B2Time-to-digital converter and related methodTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jun 23, 2015·3 cites·19 claims
- 0678US8116418B2Fast locking clock and data recoveryCHIEN JINN-YEH·Filed 2008·Granted Feb 14, 2012·11 cites·14 claims
- 0777US8536888B2Built in self test for transceiverCHIEN JINN-YEH·Filed 2010·Granted Sep 17, 2013·4 cites·19 claims
- 0871US11374561B2Integrated circuit and method of testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jun 28, 2022·0 cites·20 claims
- 0970US9189007B2Power supply regulatorKO CHEN-TING·Filed 2011·Granted Nov 17, 2015·4 cites·19 claims
- 1068US9680486B2DCO phase noise with PVT-insensitive calibration circuit in ADPLL applicationsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jun 13, 2017·2 cites·20 claims
- 1164US9448281B2In situ on the fly on-chip variation measurementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Sep 20, 2016·1 cites·20 claims
- 1257US9768762B2Integrated circuit and method of testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Sep 19, 2017·0 cites·20 claims
- 1354US10707853B2Integrated circuit and method of testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jul 7, 2020·0 cites·20 claims
- 1453US9804220B2Device testing and monitoring method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Oct 31, 2017·0 cites·20 claims
- 1551US9250612B2System and method for a time-to-digital converterTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Feb 2, 2016·0 cites·20 claims
- 1651US8363773B2Digital phase interpolation control for clock and data recovery circuitTAIWAN SEMICONDUCTOR MFG·Filed 2008·Granted Jan 29, 2013·2 cites·11 claims
- 1748US7181662B2On-chip test apparatusTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Feb 20, 2007·4 cites·9 claims
- 1844US8575967B2Smart edge detectorYANG SHU-CHUN·Filed 2012·Granted Nov 5, 2013·0 cites·20 claims
- 1941US8248105B2Smart edge detectorYANG SHU-CHUN·Filed 2010·Granted Aug 21, 2012·0 cites·16 claims
- 2030US2012212866A1Output driverKO CHEN-TING·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →