Inventor · disambiguated record
Jinde Gao
Also filed as: GAO JINDE
4 granted patents·4 pending applications·0 citations·filing 2021–2024
51Inventor score
Top patents by PatentIndex Score
8 records- 0156US12339202B2Method of failure analysis for defect locationsSHANGHAI HUALI INTEGRATED CIRCUIT CORP·Filed 2023·Granted Jun 24, 2025·0 cites·8 claims
- 0252US2023273098A1Method for Preparing TEM SampleSHANGHAI HUALI INTEGRATED CIRCUIT CORP·Filed 2023·Application pending·0 cites
- 0351US12506039B2Failure analysis and location method for short circuit structureSHANGHAI HUALI INTEGRATED CIRCUIT CORP·Filed 2023·Granted Dec 23, 2025·0 cites·8 claims
- 0449US2021348989A1Method for preparing test samples for semiconductor devicesSHANGHAI HUALI INTEGRATED CIRCUIT CORP·Filed 2021·Application pending·0 cites
- 0549US2025087453A1Nanoscale failure analysis methodSHANGHAI HUALI MICROELECT CORP·Filed 2024·Application pending·0 cites
- 0648US11315755B2Method for preparing a TEM sampleSHANGHAI HUALI INTEGRATED CIRCUIT CORP·Filed 2021·Granted Apr 26, 2022·0 cites·15 claims
- 0744US11852674B2Method for locating open circuit failure point of test structureSHANGHAI HUALI MICROELECT CORP·Filed 2022·Granted Dec 26, 2023·0 cites·18 claims
- 0844US2021348990A1Method for preparing test samples for semiconductor devicesSHANGHAI HUALI INTEGRATED CIRCUIT CORP·Filed 2021·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Jinde Gao files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →