Inventor · disambiguated record
Jimpei Harada
Also filed as: HARADA JIMPEI
9 granted patents·145 citations·filing 1999–2006
89Inventor score
Top patents by PatentIndex Score
9 records- 0180US7076026B2Beam conditioning systemOSMIC INC·Filed 2004·Granted Jul 11, 2006·21 cites·28 claims
- 0275US6249566B1Apparatus for x-ray analysisRIGAKU DENKI CO LTD·Filed 1999·Granted Jun 19, 2001·37 cites·29 claims
- 0374US6823042B2Apparatus for X-ray analysis and apparatus for supplying X-raysRIGAKU DENKI CO LTD·Filed 2002·Granted Nov 23, 2004·12 cites·8 claims
- 0473US6970532B2Method and apparatus for measuring thin film, and thin film deposition systemRIGAKU DENKI CO LTD·Filed 2001·Granted Nov 29, 2005·13 cites·5 claims
- 0573US6813338B2Method for measuring powder x-ray diffraction data using one-or-two-dimensional detectorJAPAN SYNCHROTRON RADIATION RESEARCH INST·Filed 2002·Granted Nov 2, 2004·20 cites·6 claims
- 0672US6385281B1Fluorescent x-ray analyzing method and apprartusRIGAKU DENKI CO LTD·Filed 2000·Granted May 7, 2002·10 cites·20 claims
- 0766US7280634B2Beam conditioning system with sequential opticOSMIC INC·Filed 2006·Granted Oct 9, 2007·4 cites·13 claims
- 0862US6198796B1Method and apparatus of automatically selecting bragg reflections, method and system of automatically determining crystallographic orientationRIGAKU DENKI CO LTD·Filed 1999·Granted Mar 6, 2001·24 cites·29 claims
- 0960US7337098B2Diffraction condition simulation device, diffraction measurement system, and crystal analysis systemRIGAKU DENKI CO LTD·Filed 2002·Granted Feb 26, 2008·4 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →