Inventor · disambiguated record
Jimmy W. Hosch
Also filed as: HOSCH JIMMY W
4 granted patents·158 citations·filing 1992–2009
81Inventor score
Top patents by PatentIndex Score
4 records- 0188US9997325B2Electron beam exciter for use in chemical analysis in processing systemsHOSCH JIMMY W·Filed 2009·Granted Jun 12, 2018·24 cites·9 claims
- 0285US5361137AProcess control for submicron linewidth measurementTEXAS INSTRUMENTS INC·Filed 1992·Granted Nov 1, 1994·56 cites·8 claims
- 0384US6830939B2System and method for determining endpoint in etch processes using partial least squares discriminant analysis in the time domain of optical emission spectraVERITY INSTR INC·Filed 2002·Granted Dec 14, 2004·39 cites·29 claims
- 0476US5422723ADiffraction gratings for submicron linewidth measurementTEXAS INSTRUMENTS INC·Filed 1992·Granted Jun 6, 1995·39 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →