Inventor · disambiguated record
Ji Hun Jung
Also filed as: JUNG JI HUN
4 granted patents·6 pending applications·9 citations·filing 2006–2022
64Inventor score
Top patents by PatentIndex Score
10 records- 0184US12100837B2Method of preparing positive electrode active material precursor and positive electrode active material precursorLG CHEMICAL LTD·Filed 2020·Granted Sep 24, 2024·1 cites·12 claims
- 0273US9003271B2Error detecting device and method of a dual controller systemJUNG JI-HUN·Filed 2011·Granted Apr 7, 2015·7 cites·14 claims
- 0368US9389197B2Barrier film defect detecting method and apparatusSAMSUNG DISPLAY CO LTD·Filed 2013·Granted Jul 12, 2016·1 cites·14 claims
- 0462US2024109789A1Positive Electrode Active Material and Method of Preparing the SameLG CHEMICAL LTD·Filed 2022·Application pending·0 cites
- 0559US2023402598A1Positive Electrode Active Material and Method of Preparing the SameLG CHEMICAL LTD·Filed 2022·Application pending·0 cites
- 0653US12132203B2Method of preparing positive electrode active material precursor for lithium secondary battery and positive electrode active material precursor prepared by the methodLG CHEMICAL LTD·Filed 2020·Granted Oct 29, 2024·0 cites·15 claims
- 0752US2023081939A1Positive Electrode Active Material Precursor for Secondary Battery, Positive Electrode Active Material, and Lithium Secondary Battery Including the Positive Electrode Active MaterialLG CHEMICAL LTD·Filed 2021·Application pending·0 cites
- 0852US2022190326A1Positive Electrode Active Material for Secondary Battery, Method of Preparing the Same, and Lithium Secondary Battery Including the Positive Electrode Active MaterialLG CHEMICAL LTD·Filed 2020·Application pending·0 cites
- 0942US2009061378A1Orthodontic wire and manufacturing method thereofKIM IN-JAE·Filed 2006·Application pending·0 cites
- 1036US2017215670A1Dust sensor, dust measuring apparatus, robot cleaner, and method of controlling the sameEVERYBOT INC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →