Inventor · disambiguated record
Jinseob Kim
Also filed as: KIM JINSEOB
7 granted patents·6 pending applications·6 citations·filing 2019–2024
73Inventor score
Files withSAMSUNG ELECTRONICS CO LTD13
Top patents by PatentIndex Score
13 records- 0194US12347096B2Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jul 1, 2025·2 cites·12 claims
- 0291US12002698B2Metrology apparatus and method based on diffraction using oblique illumination and method of manufacturing semiconductor device using the metrology methodSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jun 4, 2024·4 cites·16 claims
- 0378US2025045870A1Image measurement device and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0475US2025044222A1Image measurement device and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0572US12228499B2Pupil ellipsometry measurement apparatus and method and method of fabricating semiconductor device using the pupil ellipsometry measurement methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Feb 18, 2025·0 cites·19 claims
- 0671US12455228B2Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Oct 28, 2025·0 cites·12 claims
- 0766US11604136B2Pupil ellipsometry measurement apparatus and method and method of fabricating semiconductor device using the pupil ellipsometry measurement methodSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Mar 14, 2023·0 cites·14 claims
- 0857US12422245B2Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Sep 23, 2025·0 cites·14 claims
- 0956US2024288265A1Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1055US2025297849A1Semiconductor measurement deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1152US11898912B2Hyperspectral imaging (HSI) apparatus and inspection apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Feb 13, 2024·0 cites·20 claims
- 1252US2025012556A1Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1343US2021188320A1Method for estimating location of object, and apparatus thereforSAMSUNG ELECTRONICS CO LTD·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →