Inventor · disambiguated record
Jinsun Kim
Also filed as: KIM JINSUN
4 granted patents·5 pending applications·2 citations·filing 2014–2023
58Inventor score
Files withSAMSUNG ELECTRONICS CO LTD5ELECTRONICS & TELECOMMUNICATIONS RES INST3SAMSUNG DISPLAY CO LTD1
Top patents by PatentIndex Score
9 records- 0170US10453642B2Charged particle generation device and target unitELECTRONICS & TELECOMMUNICATIONS RES INST·Filed 2018·Granted Oct 22, 2019·1 cites·11 claims
- 0267US10056221B2Apparatus for generating charged particlesELECTRONICS & TELECOMMUNICATIONS RES INST·Filed 2017·Granted Aug 21, 2018·1 cites·12 claims
- 0351US2024133683A1Overlay measuring method and system, and method of manufacturing a semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0450US2014240645A1Photosensitive resin composition, display device using the same and method of manufacturing the display deviceSAMSUNG DISPLAY CO LTD·Filed 2014·Application pending·0 cites
- 0549US10434336B2Ion therapy device and therapy method using ion beamELECTRONICS & TELECOMMUNICATIONS RES INST·Filed 2017·Granted Oct 8, 2019·0 cites·17 claims
- 0649US2024219845A1Overlay measurement method and method of manufacturing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0748US2023411393A1Overlay measuring method and semiconductor device fabricated using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0846US2024136234A1Method of measuring overlay offset and method of manufacturing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0944US11456222B2Overlay correction method and semiconductor fabrication method including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Sep 27, 2022·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →